Optoelectronic and microstructure attributes of epitaxial SrTiO3 on Si
Myhajlenko, S., Bell, A., Ponce, F., Edwards, J. L., Wei, Y., Craigo, B., Convey, D., Li, H., Liu, R., Kulik, J.
Published in Journal of applied physics (01.01.2005)
Published in Journal of applied physics (01.01.2005)
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Journal Article
Nano-imprint lithography: Templates, imprinting and wafer pattern transfer
Dauksher, W.J., Le, N.V., Ainley, E.S., Nordquist, K.J., Gehoski, K.A., Young, S.R., Baker, J.H., Convey, D., Mangat, P.S.
Published in Microelectronic engineering (01.04.2006)
Published in Microelectronic engineering (01.04.2006)
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Conference Proceeding
Step and Flash Imprint Lithography Modeling and Process Development
Johnson, S., Burns, R., Kim, E. K., Schmid, G., Dicky, M., Meiring, J., Burns, S., Stacey, N., Wilson, C. G., Convey, D., Wei, Y., Fejes, P., Gehoski, K., Mancini, D., Nordquist, K., Dauksher, W. J., Resnick, D. J.
Published in Journal of Photopolymer Science and Technology (01.01.2004)
Published in Journal of Photopolymer Science and Technology (01.01.2004)
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Spectroscopic ellipsometry and reflectometry: a user's perspective
Tompkins, H.G., Baker, J.H., Smith, S., Convey, D.
Published in 2000 Digest of the LEOS Summer Topical Meetings. Electronic-Enhanced Optics. Optical Sensing in Semiconductor Manufacturing. Electro-Optics in Space. Broadband Optical Networks (Cat. No.00TH8497) (2000)
Published in 2000 Digest of the LEOS Summer Topical Meetings. Electronic-Enhanced Optics. Optical Sensing in Semiconductor Manufacturing. Electro-Optics in Space. Broadband Optical Networks (Cat. No.00TH8497) (2000)
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Conference Proceeding
A MOCVD reactor safety system for a production environment
Johnson, Eric, Tsui, R., Convey, D., Mellen, N., Curless, J.
Published in Journal of crystal growth (01.09.1984)
Published in Journal of crystal growth (01.09.1984)
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Journal Article
Optoelectronic and microstructure attributes of epitaxial Sr Ti O 3 on Si
Myhajlenko, S., Bell, A., Ponce, F., Edwards, J. L., Wei, Y., Craigo, B., Convey, D., Li, H., Liu, R., Kulik, J.
Published in Journal of applied physics (09.12.2004)
Published in Journal of applied physics (09.12.2004)
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Journal Article
Optimizing the ellipsometric analysis of a transparent layer on glass
Tompkins, Harland G., Smith, Steven, Convey, Diana
Published in Surface and interface analysis (01.12.2000)
Published in Surface and interface analysis (01.12.2000)
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Journal Article
Spectroscopic ellipsometry measurements of thin metal films
Tompkins, Harland G., Tasic, Sonja, Baker, Jeff, Convey, Diana
Published in Surface and interface analysis (01.03.2000)
Published in Surface and interface analysis (01.03.2000)
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Conference Proceeding
Determining the amount of Si-Si bonding in CVD oxynitrides
Tompkins, Harland G., Smith, Steven, Convey, Diana, Gregory, R. B., Kottke, M. L., Collins, David
Published in Surface and interface analysis (01.02.2003)
Published in Surface and interface analysis (01.02.2003)
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Conference Proceeding
Effect of process parameters on the optical constants of thin metal films
Tompkins, Harland G., Baker, Jeffrey H., Convey, Diana
Published in Surface and interface analysis (01.03.2000)
Published in Surface and interface analysis (01.03.2000)
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Journal Article
Conference Proceeding
Trends in Antarctic Terrestrial and Limnetic Ecosystems: Antarctica as a global indicator
Walton, D W H, Bergstrom; Convey; Huiskes, D M ; P ; A H L
Published in Antarctic science (01.12.2008)
Published in Antarctic science (01.12.2008)
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