Atomic-Scale Patterning of Arsenic in Silicon by Scanning Tunneling Microscopy
Stock, Taylor J. Z, Warschkow, Oliver, Constantinou, Procopios C, Li, Juerong, Fearn, Sarah, Crane, Eleanor, Hofmann, Emily V. S, Kölker, Alexander, McKenzie, David R, Schofield, Steven R, Curson, Neil J
Published in ACS nano (24.03.2020)
Published in ACS nano (24.03.2020)
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Journal Article
Non‐Destructive X‐Ray Imaging of Patterned Delta‐Layer Devices in Silicon
D'Anna, Nicolò, Ferreira Sanchez, Dario, Matmon, Guy, Bragg, Jamie, Constantinou, Procopios C., Stock, Taylor J.Z., Fearn, Sarah, Schofield, Steven R., Curson, Neil J., Bartkowiak, Marek, Soh, Y., Grolimund, Daniel, Gerber, Simon, Aeppli, Gabriel
Published in Advanced electronic materials (01.05.2023)
Published in Advanced electronic materials (01.05.2023)
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Journal Article
Single‐Atom Control of Arsenic Incorporation in Silicon for High‐Yield Artificial Lattice Fabrication
Stock, Taylor J. Z., Warschkow, Oliver, Constantinou, Procopios C., Bowler, David R., Schofield, Steven R., Curson, Neil J.
Published in Advanced materials (Weinheim) (01.06.2024)
Published in Advanced materials (Weinheim) (01.06.2024)
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Journal Article
Resistless EUV lithography: Photon-induced oxide patterning on silicon
Tseng, Li-Ting, Karadan, Prajith, Kazazis, Dimitrios, Constantinou, Procopios C, Stock, Taylor J Z, Curson, Neil J, Schofield, Steven R, Muntwiler, Matthias, Aeppli, Gabriel, Ekinci, Yasin
Published in Science advances (21.04.2023)
Published in Science advances (21.04.2023)
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Journal Article
Spatially resolved dielectric loss at the Si/SiO$_2$ interface
Cowie, Megan, Stock, Taylor J. Z, Constantinou, Procopios C, Curson, Neil, Grütter, Peter
Year of Publication 23.06.2023
Year of Publication 23.06.2023
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Journal Article
Spatially resolved random telegraph fluctuations of a single trap at the Si/SiO2 interface
Cowie, Megan, Constantinou, Procopios C, Curson, Neil J, Stock, Taylor J Z, Grutter, Peter
Published in arXiv.org (14.03.2024)
Published in arXiv.org (14.03.2024)
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Paper
Journal Article
Single-Atom Control of Arsenic Incorporation in Silicon for High-Yield Artificial Lattice Fabrication
Stock, Taylor J Z, Warschkow, Oliver, Constantinou, Procopios C, Bowler, David R, Schofield, Steven R, Curson, Neil J
Published in arXiv.org (09.11.2023)
Published in arXiv.org (09.11.2023)
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Paper
Journal Article
Resistless EUV lithography: photon-induced oxide patterning on silicon
Li-Ting, Tseng, Karadan, Prajith, Kazazis, Dimitrios, Constantinou, Procopios C, Stock, Taylor J Z, Curson, Neil J, Schofield, Steven R, Muntwiler, Matthias, Aeppli, Gabriel, Ekinci, Yasin
Published in arXiv.org (02.10.2023)
Published in arXiv.org (02.10.2023)
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Paper
Journal Article
Non-destructive X-ray imaging of patterned delta-layer devices in silicon
D'Anna, Nicolò, Dario Ferreira Sanchez, Matmon, Guy, Bragg, Jamie, Constantinou, Procopios C, Stock, Taylor J Z, Fearn, Sarah, Schofield, Steven R, Curson, Neil J, Bartkowiak, Marek, Soh, Y, Grolimund, Daniel, Gerber, Simon, Aeppli, Gabriel
Published in arXiv.org (14.04.2023)
Published in arXiv.org (14.04.2023)
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Paper
Journal Article
Spatially resolved dielectric loss at the Si/SiO\(_2\) interface
Cowie, Megan, Stock, Taylor J Z, Constantinou, Procopios C, Curson, Neil, Grütter, Peter
Published in arXiv.org (05.04.2024)
Published in arXiv.org (05.04.2024)
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Paper
Atomic-Scale Patterning of Arsenic in Silicon by Scanning Tunneling Microscopy
Stock, Taylor J Z, Warschkow, Oliver, Constantinou, Procopios C, Li, Juerong, Fearn, Sarah, Crane, Eleanor, Hofmann, Emily V S, Kölker, Alexander, McKenzie, David R, Schofield, Steven R, Curson, Neil J
Published in arXiv.org (15.10.2019)
Published in arXiv.org (15.10.2019)
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Journal Article