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Development of a supporting system for visual inspection of IGBT device based on statistical feature and complex multi-resolution analysis

by Yuki, Daisuke, Hyoungseop Kim, Joo Kooi Tan, Ishikawa, Seiji, Tsukuda, Masanori, Omura, Ichiro
Published in ICCAS : 2015 15th International Conference on Control, Automation and Systems : 13-16 October 2015 (01.10.2015)

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