Failure mechanism of avalanche photodiodes in the presence of water vapor
Comizzoli, R.B., Osenbach, J.W., Crane, G.R., Peins, G.A., Siconolfi, D.J., Lorimor, O.G., Chang, C.-C.
Published in Journal of lightwave technology (01.02.2001)
Published in Journal of lightwave technology (01.02.2001)
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Journal Article
Corrosion of Electronic Materials and Devices
Comizzoli, R. B., Frankenthal, R. P., Milner, P. C., Sinclair, J. D.
Published in Science (American Association for the Advancement of Science) (17.10.1986)
Published in Science (American Association for the Advancement of Science) (17.10.1986)
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Journal Article
The Kuwait environment and its effects on electronic materials and components
COMIZZOLI, R. B, FRANEY, J. P, SPROLES, E. S, GRAEDEL, T. E, KAMMLOTT, G. W, MILLER, A. E, MULLER, A. J, PEINS, G. A, PSOTA-KELTY, L. A, SINCLAIR, J. D, WETZEL, R. C
Published in Journal of the Electrochemical Society (1992)
Published in Journal of the Electrochemical Society (1992)
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Journal Article
Electrochemical aspects of corrosion resistance and etching of metallizations for microelectronics
Comizzoli, R.B., Frankenthal, R.P., Hanson, K.J., Konstadinidis, K., Opila, R.L., Sapjeta, J., Sinclair, J.D., Takahashi, K.M., Frank, A.L., Ibidunni, A.O.
Published in Materials science & engineering. A, Structural materials : properties, microstructure and processing (15.07.1995)
Published in Materials science & engineering. A, Structural materials : properties, microstructure and processing (15.07.1995)
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Journal Article
Conference Proceeding
high-reliability 1.3-μm InP-based uncooled lasers in nonhermetic packages
CHAND, N, OSENBACH, J. W, EVANOSKY, T. L, COMIZZOLI, R. B, TSANG, W. T
Published in IEEE journal of quantum electronics (01.09.1996)
Published in IEEE journal of quantum electronics (01.09.1996)
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Journal Article
Stress free and moisture insensitive silicon oxide dielectric films formed by molecular-beam deposition
Chand, Naresh, Kola, R. R., Opila, R. L., Comizzoli, R. B., Krautter, H., Sergent, A. M., Tsang, W. T., Osenbach, J. W., Luftman, H. S.
Published in Journal of applied physics (01.09.1995)
Published in Journal of applied physics (01.09.1995)
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Journal Article
Materials reliability issues with coaxial cable systems for the information superhighway
Comizzoli, R. B., Crane, G. R., Fiorino, M. E., Frankenthal, R. P., Krautter, H. W., Peins, G. A., Siconolfi, D. J., Sinclair, J. D.
Published in Journal of materials research (01.03.1997)
Published in Journal of materials research (01.03.1997)
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Journal Article
Transverse electric field dependence of conductivity in semi-insulating polycrystalline silicon
COMIZZOLI, R. B, WESTON, H. T, WONG, Y. H, KOHL, J. E
Published in Journal of the Electrochemical Society (01.08.1986)
Published in Journal of the Electrochemical Society (01.08.1986)
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Journal Article
Reliability implications of lateral alkali-ion migration in MOS integrated circuits
SCHNABLE, G. L, SCHLESIER, K. M, WU, C. P, COMIZZOLI, R. B
Published in Journal of the Electrochemical Society (01.11.1994)
Published in Journal of the Electrochemical Society (01.11.1994)
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Journal Article
Passivation Coatings on Silicon Devices
Schnable, G. L., Kern, W., Comizzoli, R. B.
Published in Journal of the Electrochemical Society (01.01.1975)
Published in Journal of the Electrochemical Society (01.01.1975)
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Journal Article
Highly accelerated life testing for non-hermetic laser modules
Theis, C.D., Siconolfi, D.J., Comizzoli, R.B., Kiely, P.A., Wu, P., Chakrabarti, U.K., Osenbach, J.W.
Published in 2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070) (2000)
Published in 2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070) (2000)
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Conference Proceeding
Robust materials and processes: Key to reliability
Comizzoli, Robert B., Landwehr, James M., Sinclair, J. Douglas
Published in AT&T Technical Journal (01.11.1990)
Published in AT&T Technical Journal (01.11.1990)
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Journal Article