Carrier dynamics at trench defects in InGaN/GaN quantum wells revealed by time-resolved cathodoluminescence
Kusch, Gunnar, Comish, Ella J, Loeto, Kagiso, Hammersley, Simon, Kappers, Menno J, Dawson, Phil, Oliver, Rachel A, Massabuau, Fabien C.-P
Published in Nanoscale (06.01.2022)
Published in Nanoscale (06.01.2022)
Get full text
Journal Article