Comments on "Combinatorial rule explosion eliminated by a fuzzy rule configuration" [with reply]
Mendel, J.M., Qilian Liang, Combs, W.E.
Published in IEEE transactions on fuzzy systems (01.06.1999)
Published in IEEE transactions on fuzzy systems (01.06.1999)
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Physical mechanisms contributing to enhanced bipolar gain degradation at low dose rates
Fleetwood, D.M., Kosier, S.L., Nowlin, R.N., Schrimpf, R.D., Reber, R.A., DeLaus, M., Winokur, P.S., Wei, A., Combs, W.E., Pease, R.L.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1994)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1994)
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Conference Proceeding
Comparison of ionizing-radiation-induced gain degradation in lateral, substrate, and vertical PNP BJTs
Schmidt, D.M., Fleetwood, D.M., Schrimpf, R.D., Pease, R.L., Graves, R.J., Johnson, G.H., Galloway, K.F., Combs, W.E.
Published in IEEE transactions on nuclear science (01.12.1995)
Published in IEEE transactions on nuclear science (01.12.1995)
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Journal Article
Charge separation for bipolar transistors
Kosier, S.L., Schrimpf, R.D., Nowlin, R.N., Fleetwood, D.M., DeLaus, M., Pease, R.L., Combs, W.E., Wei, A., Chai, F.
Published in IEEE transactions on nuclear science (01.12.1993)
Published in IEEE transactions on nuclear science (01.12.1993)
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Journal Article
Conference Proceeding
Trends in the total-dose response of modern bipolar transistors
Nowlin, R.N., Enlow, E.W., Schrimpf, R.D., Combs, W.E.
Published in IEEE transactions on nuclear science (01.12.1992)
Published in IEEE transactions on nuclear science (01.12.1992)
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Journal Article
Conference Proceeding
Hardness-assurance and testing issues for bipolar/BiCMOS devices
Nowlin, R.N., Fleetwood, D.M., Schrimpf, R.D., Pease, R.L., Combs, W.E.
Published in IEEE transactions on nuclear science (01.12.1993)
Published in IEEE transactions on nuclear science (01.12.1993)
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Journal Article
Conference Proceeding
Hardness-assurance issues for lateral PNP bipolar junction transistors
Schrimpf, R.D., Graves, R.J., Schmidt, D.M., Fleetwood, D.M., Pease, R.L., Combs, W.E., DeLaus, M.
Published in IEEE transactions on nuclear science (01.12.1995)
Published in IEEE transactions on nuclear science (01.12.1995)
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Journal Article
Bounding the total-dose response of modern bipolar transistors
Kosier, S.L., Combs, W.E., Wei, A., Schrimpf, R.A., Fleetwood, D.M., DeLaus, M., Pease, R.L.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1994)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1994)
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Conference Proceeding
First observations of enhanced low dose rate sensitivity (ELDRS) in space: One part of the MPTB experiment
Titus, J.L., Combs, W.E., Turflinger, T.L., Krieg, J.F., Tausch, H.J., Brown, D.B., Pease, R.L., Campbell, A.B.
Published in IEEE transactions on nuclear science (01.12.1998)
Published in IEEE transactions on nuclear science (01.12.1998)
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Journal Article
Excess collector current due to an oxide-trapped-charge-induced emitter in irradiated NPN BJT's
Wei, A., Kosier, S.L., Schrimpf, R.D., Combs, W.E., DeLaus, M.
Published in IEEE transactions on electron devices (01.05.1995)
Published in IEEE transactions on electron devices (01.05.1995)
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Journal Article
Gain degradation of lateral and substrate pnp bipolar junction transistors
Witczak, S.C., Schrimpf, R.D., Galloway, K.F., Fleetwood, D.M., Pease, R.L., Puhl, J.M., Schmidt, D.M., Combs, W.E., Suehle, J.S.
Published in IEEE transactions on nuclear science (01.12.1996)
Published in IEEE transactions on nuclear science (01.12.1996)
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Journal Article
Comparison of hot-carrier and radiation induced increases in base current in bipolar transistors
Pease, R.L., Kosier, S.L., Schrimpf, R.D., Combs, W.E., Davey, M., DeLaus, M., Fleetwood, D.M.
Published in IEEE transactions on nuclear science (01.12.1994)
Published in IEEE transactions on nuclear science (01.12.1994)
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Conference Proceeding