A versatile lab-on-chip test platform to characterize elementary deformation mechanisms and electromechanical couplings in nanoscopic objects
Pardoen, Thomas, Colla, Marie-Sthéphane, Idrissi, Hosni, Amin-Ahmadi, Behnam, Wang, Binjie, Schryvers, Dominique, Bhaskar, Umesh K., Raskin, Jean-Pierre
Published in Comptes rendus. Physique (01.03.2016)
Published in Comptes rendus. Physique (01.03.2016)
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Journal Article