by Colinge, J.P., Kranti, A., Yan, R., Lee, C.W., Ferain, I., Yu, R., Dehdashti Akhavan, N., Razavi, P.
Published in Solid-state electronics (01.11.2011)

by Colinge, J.P.
Published in Microelectronic engineering (01.09.2007)

by Diaz Llorente, C., Colinge, J.-P., Martinie, S., Cristoloveanu, S., Wan, J., Le Royer, C., Ghibaudo, G., Vinet, M.
Published in Solid-state electronics (01.09.2019)

by Jong-Tae Park, Colinge, J.-P.
Published in IEEE transactions on electron devices (01.12.2002)

by KRANTI, A, LEE, C.-W, FERAIN, I, YAN, R, AKHAVAN, N, RAZAVI, P, YU, R, ARMSTRONG, G. A, COLINGE, J.-P
Published in Electronics letters (28.10.2010)

by Yu, R., Nazarov, A.N., Lysenko, V.S., Das, S., Ferain, I., Razavi, P., Shayesteh, M., Kranti, A., Duffy, R., Colinge, J.-P.
Published in Solid-state electronics (01.12.2013)

by Kranti, A, Yan, R, Lee, C.-W, Ferain, I, Yu, R, Akhavan, N Dehdashti, Razavi, P, Colinge, J P
Published in 2010 Proceedings of the European Solid State Device Research Conference (01.09.2010)

by Diaz Llorente, C., Le Royer, C., Batude, P., Fenouillet-Beranger, C., Martinie, S., Lu, C.-M.V., Allain, F., Colinge, J.-P., Cristoloveanu, S., Ghibaudo, G., Vinet, M.
Published in Solid-state electronics (01.06.2018)

by Colinge, J.-P
Published in 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2014)

by Jong-Tae Park, Colinge, J.-P., Diaz, C.H.
Published in IEEE electron device letters (01.08.2001)

by Colinge, J.-P., Quinn, A.J., Floyd, L., Redmond, G., Alderman, J.C., Weize Xiong, Cleavelin, C.R., Schulz, T., Schruefer, K., Knoblinger, G., Patruno, P.
Published in IEEE electron device letters (01.02.2006)

by Colinge, J.-P., Alderman, J.C., Weize Xiong, Cleavelin, C.R.
Published in IEEE transactions on electron devices (01.05.2006)

by Raskin, J.-P., Viviani, A., Flandre, D., Colinge, J.-P.
Published in IEEE transactions on electron devices (01.12.1997)

by Colinge, J.-P., Floyd, L., Quinn, A.J., Redmond, G., Alderman, J.C., Xiong, W., Cleavelin, C.R., Schulz, T., Schruefer, K., Knoblinger, G., Patruno, P.
Published in IEEE electron device letters (01.03.2006)

by Colinge, J. P., Orozco, A., Rudee, J., Xiong, Weize, Cleavelin, C. Rinn, Schulz, T., Schrufer, K., Knoblinger, G., Patruno, P.
Published in IEEE transactions on nuclear science (01.12.2006)

by Lee, C.-W., Afzalian, A., Yan, R., Akhavan, N.D., Weize Xiong, Colinge, J.-P.
Published in IEEE transactions on electron devices (01.12.2008)

by Frei, J., Johns, C., Vazquez, A., Weize Xiong, Cleavelin, C.R., Schulz, T., Chaudhary, N., Gebara, G., Zaman, J.R., Gostkowski, M., Matthews, K., Colinge, J.-P.
Published in IEEE electron device letters (01.12.2004)

by Barrett, C., Lederer, D., Redmond, G., Xiong, W., Colinge, J.P., Quinn, A.J.
Published in Solid-state electronics (01.11.2010)

by Colinge, J.-P.
Published in IEEE transactions on electron devices (01.05.1998)

by Colinge, J.P., Park, J.W., Xiong, W.
Published in IEEE electron device letters (01.08.2003)