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Year of Publication 14.06.2022
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Year of Publication 14.06.2022
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Method of deep learning-based examination of a semiconductor specimen and system thereof
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Year of Publication 31.05.2022
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Year of Publication 31.05.2022
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Determining a critical dimension variation of a pattern
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Year of Publication 15.03.2022
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Year of Publication 15.03.2022
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METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIMEN AND SYSTEM THEREOF
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Year of Publication 03.03.2022
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Year of Publication 03.03.2022
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System and methods of generating comparable regions of a lithographic mask
Dassa, Oded O, Lifschitz, Sivan, Cohen, Boaz, Attal, Shay, Greenberg, Gadi, Parizat, Ziv
Year of Publication 01.03.2022
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Year of Publication 01.03.2022
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Method of deep learning-based examination of a semiconductor specimen and system thereof
Karlinsky, Leonid, Cohen, Boaz, Rosenman, Efrat, Batikoff, Amit, Kaizerman, Idan, Ravid, Daniel, Rosenweig, Moshe
Year of Publication 21.12.2021
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Year of Publication 21.12.2021
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MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN
MADMON, Ronen, BAL, Evgeny, PETEL, Ori, OVECHKIN, Vladimir, COHEN, Oren Shmuel, SHKALIM, Ariel, COHEN, Boaz, CHERESHNYA, Alexander
Year of Publication 11.08.2022
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Year of Publication 11.08.2022
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METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF
ENGLER, Shaul, SHABTAY, Saar, BAR, Amir, SOFER, Yotam, COHEN, Boaz, BACHER, Marcelo Gabriel
Year of Publication 05.08.2021
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Year of Publication 05.08.2021
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SYSTEM AND METHODS OF GENERATING COMPARABLE REGIONS OF A LITHOGRAPHIC MASK
Dassa, Oded O, Lifschitz, Sivan, Cohen, Boaz, Attal, Shay, Greenberg, Gadi, Parizat, Ziv
Year of Publication 29.07.2021
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Year of Publication 29.07.2021
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MACHINE LEARNING-BASED DEFECT DETECTION OF A SPECIMEN
SUHANOV, Denis, BADANES, Ran, SCHLEYEN, Ran, SHTALRID, Ore, COHEN, Boaz, PELEG, Irad
Year of Publication 08.07.2021
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Year of Publication 08.07.2021
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Mask inspection of a semiconductor specimen
Cohen, Boaz, Shkalim, Ariel, Chereshnya, Alexander, Cohen, Oren Shmuel, Ovechkin, Vladimir, Petel, Ori, Madmon, Ronen, Bal, Evgeny
Year of Publication 31.05.2022
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Year of Publication 31.05.2022
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Method of classifying defects in a semiconductor specimen and system thereof
Gan-Or, Shiran, Cohen, Boaz, Savchenko, Kirill, Asbag, Assaf, Shaubi, Ohad, Zohar, Zeev
Year of Publication 15.06.2021
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Year of Publication 15.06.2021
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Method of deep learning-based examination of a semiconductor specimen and system thereof
Karlinsky, Leonid, Cohen, Boaz, Rosenman, Efrat, Batikoff, Amit, Kaizerman, Idan, Ravid, Daniel, Rosenweig, Moshe
Year of Publication 18.05.2021
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Year of Publication 18.05.2021
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