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Selecting a coreset of potential defects for estimating expected defects of interest

Selecting a coreset of potential defects for estimating expected defects of interest

by Bar, Amir, Engler, Shaul, Sofer, Yotam, Cohen, Boaz, Bacher, Marcelo Gabriel, Shabtay, Saar
Year of Publication 14.06.2022

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Patent

Method of deep learning-based examination of a semiconductor specimen and system thereof

Method of deep learning-based examination of a semiconductor specimen and system thereof

by Karlinsky, Leonid, Cohen, Boaz, Rosenman, Efrat, Batikoff, Amit, Kaizerman, Idan, Ravid, Daniel, Rosenweig, Moshe
Year of Publication 31.05.2022

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Patent

CLASSIFYING DEFECTS IN A SEMICONDUCTOR SPECIMEN

CLASSIFYING DEFECTS IN A SEMICONDUCTOR SPECIMEN

by ASBAG, Assaf, GAN-OR, Shiran, COHEN, Boaz
Year of Publication 25.06.2020

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Patent

METHOD OF CLASSIFYING DEFECTS IN A SPECIMEN SEMICONDUCTOR EXAMINATION AND SYSTEM THEREOF

METHOD OF CLASSIFYING DEFECTS IN A SPECIMEN SEMICONDUCTOR EXAMINATION AND SYSTEM THEREOF

by ASBAG, Assaf, GAN-OR, Shiran, COHEN, Boaz
Year of Publication 25.06.2020

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Patent

Determining a critical dimension variation of a pattern

Determining a critical dimension variation of a pattern

by Vereschagin, Vadim, Cohen, Boaz, Kris, Roman, Shkalim, Ariel, Schwarzband, Ishai, Bal, Evgeny
Year of Publication 15.03.2022

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Patent

METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIMEN AND SYSTEM THEREOF

METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIMEN AND SYSTEM THEREOF

by KAIZERMAN, Idan, BATIKOFF, Amit, RAVID, Daniel, ROSENWEIG, Moshe, ROSENMAN, Efrat, KARLINSKY, Leonid, COHEN, Boaz
Year of Publication 03.03.2022

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Patent

System and methods of generating comparable regions of a lithographic mask

System and methods of generating comparable regions of a lithographic mask

by Dassa, Oded O, Lifschitz, Sivan, Cohen, Boaz, Attal, Shay, Greenberg, Gadi, Parizat, Ziv
Year of Publication 01.03.2022

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Patent

Guided inspection of a semiconductor wafer based on systematic defects

Guided inspection of a semiconductor wafer based on systematic defects

by Sofer, Yotam, Cohen, Boaz, Shabtay, Saar, Buchman, Eli
Year of Publication 31.03.2020

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Patent

Method of deep learning-based examination of a semiconductor specimen and system thereof

Method of deep learning-based examination of a semiconductor specimen and system thereof

by Karlinsky, Leonid, Cohen, Boaz, Rosenman, Efrat, Batikoff, Amit, Kaizerman, Idan, Ravid, Daniel, Rosenweig, Moshe
Year of Publication 21.12.2021

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Patent

GUIDED INSPECTION OF A SEMICONDUCTOR WAFER BASED ON SYSTEMATIC DEFECTS

GUIDED INSPECTION OF A SEMICONDUCTOR WAFER BASED ON SYSTEMATIC DEFECTS

by Sofer, Yotam, Cohen, Boaz, Shabtay, Saar, Buchman, Eli
Year of Publication 02.01.2020

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Patent

System and method for patch based inspection

System and method for patch based inspection

by Karlinsky Leonid, Cohen Boaz, Rosenweig Moshe
Year of Publication 27.02.2018

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Patent

MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN

MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN

by MADMON, Ronen, BAL, Evgeny, PETEL, Ori, OVECHKIN, Vladimir, COHEN, Oren Shmuel, SHKALIM, Ariel, COHEN, Boaz, CHERESHNYA, Alexander
Year of Publication 11.08.2022

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Patent

METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF

METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF

by ENGLER, Shaul, SHABTAY, Saar, BAR, Amir, SOFER, Yotam, COHEN, Boaz, BACHER, Marcelo Gabriel
Year of Publication 05.08.2021

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Patent

System, method and computer program product for classifying a plurality of items

System, method and computer program product for classifying a plurality of items

by COHEN, BOAZ, ASBAG, ASSAF
Year of Publication 16.08.2019

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Patent

SYSTEM AND METHODS OF GENERATING COMPARABLE REGIONS OF A LITHOGRAPHIC MASK

SYSTEM AND METHODS OF GENERATING COMPARABLE REGIONS OF A LITHOGRAPHIC MASK

by Dassa, Oded O, Lifschitz, Sivan, Cohen, Boaz, Attal, Shay, Greenberg, Gadi, Parizat, Ziv
Year of Publication 29.07.2021

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Patent

MACHINE LEARNING-BASED DEFECT DETECTION OF A SPECIMEN

MACHINE LEARNING-BASED DEFECT DETECTION OF A SPECIMEN

by SUHANOV, Denis, BADANES, Ran, SCHLEYEN, Ran, SHTALRID, Ore, COHEN, Boaz, PELEG, Irad
Year of Publication 08.07.2021

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Patent

Mask inspection of a semiconductor specimen

Mask inspection of a semiconductor specimen

by Cohen, Boaz, Shkalim, Ariel, Chereshnya, Alexander, Cohen, Oren Shmuel, Ovechkin, Vladimir, Petel, Ori, Madmon, Ronen, Bal, Evgeny
Year of Publication 31.05.2022

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Patent

Method of classifying defects in a semiconductor specimen and system thereof

Method of classifying defects in a semiconductor specimen and system thereof

by Gan-Or, Shiran, Cohen, Boaz, Savchenko, Kirill, Asbag, Assaf, Shaubi, Ohad, Zohar, Zeev
Year of Publication 15.06.2021

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Patent

METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIMEN AND SYSTEM THEREOF

METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIMEN AND SYSTEM THEREOF

by ASBAG, Assaf, SUHANOV, Denis, SHAUBI, Ohad, COHEN, Boaz
Year of Publication 15.08.2019

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Patent

Method of deep learning-based examination of a semiconductor specimen and system thereof

Method of deep learning-based examination of a semiconductor specimen and system thereof

by Karlinsky, Leonid, Cohen, Boaz, Rosenman, Efrat, Batikoff, Amit, Kaizerman, Idan, Ravid, Daniel, Rosenweig, Moshe
Year of Publication 18.05.2021

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Patent

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