In-Product BTI Aging Sensor for Reliability Screening and Early Detection of Material at Risk
Brozek, Tomasz, Piadena, Alberto, Weiland, Larg, Quarantelli, Michele, Coccoli, Alberto, Saxena, Sharad, Hess, Christopher, Strojwas, Andrzej
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
EMI Susceptibility of a Digitally Based Analog Amplifier in a 180-nm CMOS Process
Coccoli, Alberto, Richelli, Anna, Redoute, Jean-Michel
Published in IEEE transactions on electromagnetic compatibility (01.08.2016)
Published in IEEE transactions on electromagnetic compatibility (01.08.2016)
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Journal Article
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