Turnkey compact frequency standard at 1556 nm based on Rb two-photon transitions
Cliche, J.F., Latrasse, C., Tetu, M., Babin, A., Tremblay, S., Tranchart, S., Poulin, D.
Published in 2004 Conference on Precision Electromagnetic Measurements (01.06.2004)
Published in 2004 Conference on Precision Electromagnetic Measurements (01.06.2004)
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