by Colinge, J.P., Weize Xiong, Cleavelin, C.R., Schulz, T., Schrufer, K., Matthews, K., Patruno, P.
Published in IEEE electron device letters (01.09.2006)

by Joshi, S., Pinto, A., Huang, Y.-T., Wise, R., Cleavelin, R., Seacrist, M., Ries, M., Ramin, M., Freeman, M., Nguyen, B., Matthews, K., Wilks, B., Denning, L., Johnson, C., Bennet, J., Ma, M., Lin, C.-T., Banerjee, S.K.
Published in IEEE transactions on electron devices (01.08.2007)

by Pacha, C., von Arnim, K., Bauer, F., Schulz, T., Xiong, W., San, K.T., Marshall, A., Baumann, T., Cleavelin, C.-R., Schruefer, K., Berthold, J.
Published in ESSCIRC 2007 - 33rd European Solid-State Circuits Conference (01.09.2007)

by Bauer, F., von Arnim, K., Pacha, C., Schulz, T., Fulde, M., Nackaerts, A., Jurczak, M., Xiong, W., San, K.T., Cleavelin, C.-R., Schrufer, K., Georgakos, G., Schmitt-Landsiedel, D.
Published in ESSCIRC 2007 - 33rd European Solid-State Circuits Conference (01.09.2007)

by Pacha, C., von Arnim, K., Bauer, F., Schulz, T., Xiong, W., San, K.T., Marshall, A., Baumann, T., Cleavelin, C.-R., Schruefer, K., Berthold, J.
Published in ESSDERC 2007 - 37th European Solid State Device Research Conference (01.09.2007)

by Colinge, J. P., Orozco, A., Rudee, J., Xiong, Weize, Cleavelin, C. Rinn, Schulz, T., Schrufer, K., Knoblinger, G., Patruno, P.
Published in IEEE transactions on nuclear science (01.12.2006)

by Colinge, J.-P., Quinn, A.J., Floyd, L., Redmond, G., Alderman, J.C., Weize Xiong, Cleavelin, C.R., Schulz, T., Schruefer, K., Knoblinger, G., Patruno, P.
Published in IEEE electron device letters (01.02.2006)

by Weize Xiong, Gebara, G., Zaman, J., Gostkowski, M., Nguyen, B., Smith, G., Lewis, D., Cleavelin, C.R., Wise, R., Shaofeng Yu, Pas, M., Tsu-Jae King, Colinge, J.P.
Published in IEEE electron device letters (01.08.2004)

by Colinge, J.-P., Floyd, L., Quinn, A.J., Redmond, G., Alderman, J.C., Xiong, W., Cleavelin, C.R., Schulz, T., Schruefer, K., Knoblinger, G., Patruno, P.
Published in IEEE electron device letters (01.03.2006)

by Colinge, J.-P., Alderman, J.C., Weize Xiong, Cleavelin, C.R.
Published in IEEE transactions on electron devices (01.05.2006)

by Shijing Yao, Morshed, Tanvir H, Lu, Darsen D, Venugopalan, Sriramkumar, Weize Xiong, Cleavelin, C R, Niknejad, Ali M, Chenming Hu
Published in 2010 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2010)

by Frei, J., Johns, C., Vazquez, A., Weize Xiong, Cleavelin, C.R., Schulz, T., Chaudhary, N., Gebara, G., Zaman, J.R., Gostkowski, M., Matthews, K., Colinge, J.-P.
Published in IEEE electron device letters (01.12.2004)

by Onsongo, D., Kelly, D.Q., Dey, S., Wise, R.L., Cleavelin, C.R., Banerjee, S.K.
Published in IEEE transactions on electron devices (01.12.2004)

by Cleavelin, R.
Published in 10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295) (1999)

by Knoblinger, G., Kuttner, F., Marshall, A., Russ, C., Haibach, P., Patruno, P., Schulz, T., Xiong, W., Gostkowski, M., Schruefer, K., Cleavelin, C.R.
Published in 2005 IEEE International SOI Conference Proceedings (2005)

by Bassin, C., Fazan, P., Xiong, W., Cleavelin, C.R., Schulz, T., Schruefer, K., Gostkowski, M., Patruno, P., Maleville, C., Nagoga, M., Okhonin, S.
Published in 2005 IEEE International SOI Conference Proceedings (2005)

by Molzer, W., Schulz, T., Xiong, W., Cleavelin, R.C., Schrufer, K., Marshall, A., Matthews, K., Sedlmeir, J., Siprak, D., Knoblinger, G., Bertolissi, L., Patruno, P., Colinge, J.-P.
Published in 2006 European Solid-State Device Research Conference (01.09.2006)

by Xiong, W., Cleavelin, C.R., Kohli, P., Huffman, C., Schulz, T., Schruefer, K., Gebara, G., Mathews, K., Patruno, P., Le Vaillant, Y.-M., Cayrefourcq, I., Kennard, M., Mazure, C., Shin, K., Liu, T.-J.K.
Published in IEEE electron device letters (01.07.2006)

by Kelly, D.Q., Onsongo, D., Dey, S., Wise, R., Cleavelin, R., Banerjee, S.K.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)

by Pompl, T., Mogul, H.C., Kerber, M., Haase, G., Ogawa, E., McPherson, J.W., Xiong, W., Schulz, T., Schrufer, K., Cleavelin, R.
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)