Piezoresistive Characteristics of MOSFET Channels Determined With Indentation
Schlipf, S., Clausner, A., Paul, J., Capecchi, S., Wambera, L., Meier, K., Zschech, E.
Published in IEEE transactions on electron devices (01.04.2021)
Published in IEEE transactions on electron devices (01.04.2021)
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Journal Article
Quantitative analysis of backscattered electron (BSE) contrast using low voltage scanning electron microscopy (LVSEM) and its application to Al0.22Ga0.78N/GaN layers
Garitagoitia Cid, A., Rosenkranz, R., Löffler, M., Clausner, A., Standke, Y., Zschech, E.
Published in Ultramicroscopy (01.12.2018)
Published in Ultramicroscopy (01.12.2018)
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Journal Article
Shear stress effects on the device characteristics determined with indentation testing : Student paper
Schlipf, S., Clausner, A., Paul, J., Capecchi, S., Zschech, E.
Published in 2021 IEEE International Integrated Reliability Workshop (IIRW) (04.10.2021)
Published in 2021 IEEE International Integrated Reliability Workshop (IIRW) (04.10.2021)
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Conference Proceeding
Strategy to Characterize Electromigration Short Length Effects in Cu/low-k Interconnects
Zhang, Z., Kraatz, M., Hauschildt, M., Choi, S., Clausner, A., Zschech, E., Gall, M.
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
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Conference Proceeding
Impact of Mechanical Strain on 22 nm FDSOI Device Performance using Nanoindentation
Schlipf, S., Clausner, A., Paul, J., Capecchi, S., Kurz, G., Zschech, E.
Published in 2019 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2019)
Published in 2019 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2019)
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Conference Proceeding
Nanoindentation to investigate IC stability using ring oscillator circuits as a CPI sensor
Schlipf, S., Clausner, A., Paul, J., Capecchi, S., Wambera, L., Meier, K., Zschech, E.
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding
Mechanical characterization of porous nano-thin films by use of atomic force acoustic microscopy
Kopycinska-Müller, M., Clausner, A., Yeap, K.-B., Köhler, B., Kuzeyeva, N., Mahajan, S., Savage, T., Zschech, E., Wolter, K.-J.
Published in Ultramicroscopy (01.03.2016)
Published in Ultramicroscopy (01.03.2016)
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Journal Article
Advanced methods for mechanical and structural characterization of nanoscale materials for 3D IC integration
Sander, C., Standke, Y., Niese, S., Rosenkranz, R., Clausner, A., Gall, M., Zschech, E.
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Journal Article
Conference Proceeding
Adhesion experiments on Cu-Damascene processed interconnect structures for mode III loading
Heyn, W., Melzner, H., Goller, K., Ananiev, S., Zechner, J., Clausner, A., Zschech, E.
Published in Microelectronics and reliability (01.09.2023)
Published in Microelectronics and reliability (01.09.2023)
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Journal Article
IC package related stress effects on the characteristics of ring oscillator circuits
Schlipf, S., Sander, C., Clausner, A., Paul, J., Capecchi, S., Wambera, L., Meier, K., Zschech, E.
Published in 2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (19.04.2021)
Published in 2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (19.04.2021)
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Conference Proceeding
Quantitative analysis of backscattered electron (BSE) contrast using low voltage scanning electron microscopy (LVSEM) and its application to AlGaN/GaN layers
Garitagoitia Cid, A., Rosenkranz, R., Löffler, M., Clausner, A., Standke, Y., Zschech, E.
Published in Ultramicroscopy (01.12.2018)
Published in Ultramicroscopy (01.12.2018)
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Journal Article
Treatment of congenital abdominal wall defects -a 25-year review of 132 patients
Clausner, A, Lukowitz, A, Rump, K, Berger, S, Würfel, A
Published in Pediatric surgery international (01.03.1996)
Published in Pediatric surgery international (01.03.1996)
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Journal Article
Quantitative analysis of backscattered electron (BSE) contrast using low voltage scanning electron microscopy (LVSEM) and its application to Al 0.22 Ga 0.78 N/GaN layers
Garitagoitia Cid, A, Rosenkranz, R, Löffler, M, Clausner, A, Standke, Y, Zschech, E
Published in Ultramicroscopy (01.12.2018)
Get full text
Published in Ultramicroscopy (01.12.2018)
Journal Article
Analysis of electromigration-induced backflow stresses in Cu(Mn) interconnects using high statistical sampling
Kraatz, M., Sander, C., Clausner, A., Hauschildt, M., Standke, Y., Gall, M., Zschech, E.
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
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Conference Proceeding
Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments
Warmuth, J., Giering, K.-U., Lange, A., Clausner, A., Schlipf, S., Kurz, G., Otto, M., Paul, J., Jancke, R., Aal, A., Gall, M., Zschech, E.
Published in 2018 48th European Solid-State Device Research Conference (ESSDERC) (01.09.2018)
Published in 2018 48th European Solid-State Device Research Conference (ESSDERC) (01.09.2018)
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Conference Proceeding
Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation
Clausner, A., Schlipf, S., Kurz, G., Otto, M., Paul, J., Giering, K.-U., Warmuth, J., Lange, A., Jancke, R., Aal, A., Rosenkranz, R., Gall, M., Zschech, E.
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
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Conference Proceeding
Importance of morphological findings in the progress and treatment of chest wall deformities with special reference to the value of computed tomography, echocardiography and stereophotogrammetry
Clausner, A, Clausner, G, Basche, M, Blumentritt, S, Layher, F, Vogt, L
Published in European journal of pediatric surgery (01.10.1991)
Published in European journal of pediatric surgery (01.10.1991)
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Journal Article
Cylindrical Indentation to Selectively Stress Nanoscale CMOS Transistors
Schlipf, S., Clausner, A., Paul, J., Capecchi, S., Zschech, E.
Published in IEEE transactions on device and materials reliability (01.09.2022)
Published in IEEE transactions on device and materials reliability (01.09.2022)
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Magazine Article