IBM System z10 design for RAS
Clarke, W J, Alves, L C, Dell, T J, Elfering, H, Kubala, J P, Lin, C, Mueller, M J, Werner, K
Published in IBM journal of research and development (01.01.2009)
Published in IBM journal of research and development (01.01.2009)
Get full text
Journal Article
BIT LINE ALIGNMENT FOR THE REDUCTION OF SOFT ERRORS
Clarke, William J, Carlough, Steven R, Alves, Luiz C, Muller, K. Paul
Year of Publication 06.06.2024
Get full text
Year of Publication 06.06.2024
Patent
Reliability, availability, and serviceability (RAS) of the IBM eServer z990
Fair, M L, Conklin, C R, Swaney, S B, Meaney, P J
Published in IBM journal of research and development (01.05.2004)
Published in IBM journal of research and development (01.05.2004)
Get full text
Journal Article
Fully redundant clock generation and distribution with dynamic oscillator switchover
Mueller, M. J., Weiss, U., Webel, T., Alves, L. C., Clarke, W. J., Strasser, M., Engler, E., Cautillo, G., Osterndorf, H., Schulze, J.
Published in IBM journal of research and development (01.01.2007)
Published in IBM journal of research and development (01.01.2007)
Get full text
Journal Article
RAS design for the IBM eServer z900
Alves, L C, Fair, M L, Meaney, P J, Chen, C L
Published in IBM journal of research and development (01.07.2002)
Published in IBM journal of research and development (01.07.2002)
Get full text
Journal Article
Built-in testing of unused element on chip
CLARKE WILLIAM J, KNIPS THOMAS J, MULLER K. PAUL, ALVES LUIZ C, CONKLIN CHRISTOPHER R, HUOTT WILLIAM V, KARK KEVIN W
Year of Publication 31.05.2016
Get full text
Year of Publication 31.05.2016
Patent
BUILT-IN TESTING OF UNUSED ELEMENT ON CHIP
CLARKE WILLIAM J, KNIPS THOMAS J, MULLER K. PAUL, ALVES LUIZ C, CONKLIN CHRISTOPHER R, HUOTT WILLIAM V, KARK KEVIN W
Year of Publication 17.09.2015
Get full text
Year of Publication 17.09.2015
Patent
BUILT-IN TESTING OF UNUSED ELEMENT ON CHIP
CLARKE WILLIAM J, KNIPS THOMAS J, MULLER K. PAUL, ALVES LUIZ C, CONKLIN CHRISTOPHER R, HUOTT WILLIAM V, KARK KEVIN W
Year of Publication 17.09.2015
Get full text
Year of Publication 17.09.2015
Patent
Built-in testing of unused element on chip
CLARKE WILLIAM J, KNIPS THOMAS J, MULLER K. PAUL, ALVES LUIZ C, CONKLIN CHRISTOPHER R, HUOTT WILLIAM V, KARK KEVIN W
Year of Publication 15.09.2015
Get full text
Year of Publication 15.09.2015
Patent