Identification of Electrically Stressed Regions in AlGaN/GaN-on-Si Schottky Barrier Diode Using EBIC Technique
Priesol, Juraj, Satka, Alexander, Chvala, Ales, Stoffels, Steve, Jaeger, Brice De, Decoutere, Stefaan
Published in IEEE transactions on electron devices (01.01.2021)
Published in IEEE transactions on electron devices (01.01.2021)
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Journal Article
Analysis and Modeling of Vertical Current Conduction and Breakdown Mechanisms in Semi-Insulating GaN Grown on GaN: Role of Deep Levels
Stoklas, Roman, Chvala, Ales, Sichman, Peter, Hasenohrl, Stanislav, Hascik, Stefan, Priesol, Juraj, Satka, Alexander, Kuzmik, Jan
Published in IEEE transactions on electron devices (01.05.2021)
Published in IEEE transactions on electron devices (01.05.2021)
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Journal Article
Vertical GaN Transistor with Semi‐Insulating Channel
Šichman, Peter, Stoklas, Roman, Hasenöhrl, Stanislav, Gregušová, Dagmar, Ťapajna, Milan, Hudec, Boris, Haščík, Štefan, Hashizume, Tamotsu, Chvála, Aleš, Šatka, Alexander, Kuzmík, Ján
Published in Physica status solidi. A, Applications and materials science (01.08.2023)
Published in Physica status solidi. A, Applications and materials science (01.08.2023)
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Journal Article
Analysis of multifinger power HEMTs supported by effective 3-D device electrothermal simulation
Chvála, Aleš, Marek, Juraj, Príbytný, Patrik, Šatka, Alexander, Stoffels, Steve, Posthuma, Niels, Decoutere, Stefaan, Donoval, Daniel
Published in Microelectronics and reliability (01.11.2017)
Published in Microelectronics and reliability (01.11.2017)
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Journal Article
Fast 3-D Electrothermal Device/Circuit Simulation of Power Superjunction MOSFET Based on SDevice and HSPICE Interaction
Chvala, Ales, Donoval, Daniel, Marek, Juraj, Pribytny, Patrik, Molnar, Marian, Mikolasek, Miroslav
Published in IEEE transactions on electron devices (01.04.2014)
Published in IEEE transactions on electron devices (01.04.2014)
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Journal Article
Characterization of Monolithic InAlN/GaN NAND Logic Cell Supported by Circuit and Device Simulations
Chvala, Ales, Nagy, Lukas, Marek, Juraj, Priesol, Juraj, Donoval, Daniel, Blaho, Michal, Gregusova, Dagmar, Kuzmik, Jan, Satka, Alexander
Published in IEEE transactions on electron devices (01.06.2018)
Published in IEEE transactions on electron devices (01.06.2018)
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Journal Article
Deriving the exchange times for a model of trap-assisted tunnelling
Racko, Juraj, Mikolášek, Miroslav, Kadlečíková, Magdaléna, Benko, Peter, Chvála, Aleš
Published in Journal of Electrical Engineering (01.02.2020)
Published in Journal of Electrical Engineering (01.02.2020)
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Journal Article
Characterization and evaluation of current transport properties of power SiC Schottky diode
Chvála, Aleš, Marek, Juraj, Drobný, Jakub, Stuchlíková, Ľubica, Alberto Messina, Angelo, Vinciguerra, Vincenzo, Donoval, Daniel
Published in Materials today : proceedings (01.01.2022)
Published in Materials today : proceedings (01.01.2022)
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Journal Article
Theoretical and Experimental Substractions of Device Temperature Determination Utilizing I-V Characterization Applied on AlGaN/GaN HEMT
Florovič, Martin, Kováč, Jaroslav, Chvála, Aleš, Kováč, Jaroslav, Jacquet, Jean-Claude, Delage, Sylvain Laurent
Published in Electronics (Basel) (01.11.2021)
Published in Electronics (Basel) (01.11.2021)
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Journal Article
Development of a Device for On-Die Double-Pulse Testing and Measurement of Dynamic On-Resistance of GaN HEMTs
Kozarik, Jozef, Marek, Juraj, Chvala, Ales, Minarik, Michal, Gasparek, Krisztian, Jagelka, Martin
Published in Advances in electrical and electronic engineering (01.12.2021)
Published in Advances in electrical and electronic engineering (01.12.2021)
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Journal Article
Improved Thermal Performance of InGaAs/GaAs Nanomembrane HEMTs Transferred onto Various Substrates by Epitaxial Lift-Off
Gucmann, Filip, Meng, Biwei, Chvála, Aleš, Kúdela, Róbert, Yuan, Chao, Ťapajna, Milan, Florovič, Martin, Egyenes, Fridrich, Eliáš, Peter, Hrubišák, Fedor, Kováč, Jaroslav, Fedor, Ján, Gregušová, Dagmar
Published in ACS applied electronic materials (19.07.2024)
Published in ACS applied electronic materials (19.07.2024)
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Journal Article
3-D electrothermal device/circuit simulation of DC-DC converter module in multi-die IC
Chvala, Ales, Donoval, Daniel, Nagy, Lukas, Marek, Juraj, Pribytny, Patrik, Molnar, Marian
Published in 2014 44th European Solid State Device Research Conference (ESSDERC) (01.09.2014)
Published in 2014 44th European Solid State Device Research Conference (ESSDERC) (01.09.2014)
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Conference Proceeding
Suppression of interface recombination by buffer layer for back contacted silicon heterojunction solar cells
MIKOLASEK, Miroslav, PRIBYTNY, Patrik, DONOVAL, Daniel, MAREK, Juraj, CHVALA, Aleš, MOLNAR, Marian, KOVAC, Jaroslav
Published in Applied surface science (01.09.2014)
Published in Applied surface science (01.09.2014)
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Journal Article
Impact of repetitive UIS on modern GaN power devices
Marek, Juraj, Stuchlikova, Lubica, Jagelka, Martin, Chvala, Ales, Pribytny, Patrik, Donoval, Martin, Donoval, Daniel
Published in 2016 11th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) (01.11.2016)
Published in 2016 11th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) (01.11.2016)
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Conference Proceeding
Neural Network for Circuit Models of Monolithic InAlN/GaN NAND and NOR Logic Gates
Chvala, Ales, Nagy, Lukas, Marek, Juraj, Priesol, Juraj, Donoval, Daniel, Satka, Alexander
Published in 2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) (01.04.2019)
Published in 2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) (01.04.2019)
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Conference Proceeding
Effective 3-D Device Electrothermal Simulation Analysis of Influence of Metallization Geometry on Multifinger Power HEMTs Properties
Chvala, Ales, Marek, Juraj, Pribytny, Patrik, Satka, Alexander, Donoval, Martin, Donoval, Daniel
Published in IEEE transactions on electron devices (01.01.2017)
Published in IEEE transactions on electron devices (01.01.2017)
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Journal Article
3-D device and circuit electrothermal simulations of power integrated circuit including package
Chvala, Ales, Benko, Peter, Pribytny, Patrik, Marek, Juraj, Donoval, Daniel
Published in 2016 11th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) (01.11.2016)
Published in 2016 11th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) (01.11.2016)
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Conference Proceeding