Reliability analyses on a TSV structure for CMOS image sensor
Ben-Je Lwo, Chung-Yen Ni
Published in 2012 IEEE 62nd Electronic Components and Technology Conference (01.05.2012)
Published in 2012 IEEE 62nd Electronic Components and Technology Conference (01.05.2012)
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Conference Proceeding
Stress coefficient extractions on MOSFET micro-sensors
Chung-Yen Ni, Ren-Tzung Tan, Hsien Chung, Kun-Fu Tseng, Ben-Je Lwo
Published in 2011 6th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) (01.10.2011)
Published in 2011 6th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) (01.10.2011)
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Conference Proceeding