An analytical model for minimum drift region length of SOI RESURF diodes
Chung, Sang-Koo, Han, Seung-Youp, Shin, Jin-Cheol, Choi, Yearn-Ik, Kim, Sang-Bae
Published in IEEE electron device letters (01.01.1996)
Published in IEEE electron device letters (01.01.1996)
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Journal Article
Sensitivity analysis of ion implanted silicon wafers after rapid thermal annealing
Kim, Youn Tae, Jun, Chi Hoon, Baek, Jong-Tae, Yoo, Hyung Joun, Chung, Sang-Koo
Published in Journal of electronic materials (01.10.1995)
Published in Journal of electronic materials (01.10.1995)
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Journal Article
A power MOSFET design methodology considering epi parameter variations
Seong-Kyu Hwang, Yearn-Ik Choi, Sang-Koo Chung, Lee, K., Choong-Ki Kim
Published in IEEE transactions on semiconductor manufacturing (01.11.1993)
Published in IEEE transactions on semiconductor manufacturing (01.11.1993)
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Journal Article
A termination structure of 2.5kV IGBT with field plate and semi-resistive (SIPOS) layer
Kim, Hyoung-Woo, Moon, Jin-Woo, Chung, Sang-Koo
Published in International journal of numerical modelling (01.07.2003)
Published in International journal of numerical modelling (01.07.2003)
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Journal Article
Temperature dependent effective ionization coefficient for Si
Chung, Yong-Sung, Park, Il-Yong, Choi, Yearn-Ik, Chung, Sang-Koo
Published in Microelectronic engineering (2000)
Published in Microelectronic engineering (2000)
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Journal Article