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Published in Small (Weinheim an der Bergstrasse, Germany) (17.08.2009)
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Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
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Silicon nanowire-based tunneling field-effect transistors on flexible plastic substrates
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Published in Nanotechnology (11.11.2009)
Published in Nanotechnology (11.11.2009)
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Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Spatial Distribution of Interface Traps in Sub-50-nm Recess-Channel-Type DRAM Cell Transistors
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Published in IEEE electron device letters (01.01.2011)
Published in IEEE electron device letters (01.01.2011)
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Leakage current mechanisms in sub-50 nm recess-channel-type DRAM cell transistors with three-terminal gate-controlled diodes
CHUNG, Eun-Ae, KIM, Young-Pil, NAM, Kab-Jin, LEE, Sungsam, MIN, Ji-Young, SHIN, Yu-Gyun, CHOI, Siyoung, JIN, Gyoyoung, MOON, Joo-Tae, KIM, Sangsig
Published in Solid-state electronics (01.02.2011)
Published in Solid-state electronics (01.02.2011)
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Published in Solid state sciences (01.06.2011)
Published in Solid state sciences (01.06.2011)
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SEMICONDUCTOR DEVICE INCLUDING FIN-TYPE FIELD EFFECT TRANSISTOR
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Year of Publication 18.08.2015
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Year of Publication 10.10.2014
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Year of Publication 10.10.2014
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MIN, JI YOUNG, CHUNG, EUN AE, NAM, GAB JIN, KIM, JIN SOAK, BAEK, SUNG KWEON
Year of Publication 25.06.2013
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Year of Publication 25.06.2013
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STATIC RANDOM ACCESS MEMORY (SRAM) CELL AND METHOD OF MANUFACTURING THE SAME
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Year of Publication 01.07.2015
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Year of Publication 01.07.2015
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METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
KIM, DONG HWAN, AN, TAE HYUN, NAKANISHI TOSHIRO, CHUNG, EUN AE, NAM, GAB JIN, KIM, SU HWAN, KIM, JIN SOAK, BAEK, SUNG KWEON
Year of Publication 21.05.2015
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Year of Publication 21.05.2015
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SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME
CHOI, JUNG DAL, MIN, JI YOUNG, CHUNG, EUN AE, NAM, GAB JIN, KIM, JIN SOAK, BAEK, SUNG KWEON
Year of Publication 10.02.2014
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Year of Publication 10.02.2014
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MANUFACTURING METHOD OF SEMICONDUCTOR DEVICES INCLUDING A RECESS CHANNEL
CHUNG, EUN AE, MIN, JI YOUNG, KIM, YOUNG PIL, NAM, GAB JIN, HWANG, HEE DON
Year of Publication 24.08.2011
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Year of Publication 24.08.2011
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METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
SHIN, YU GYUN, MIN, JI YOUNG, CHUNG, EUN AE, NAM, GAB JIN, KIM, YOUNG PIL
Year of Publication 25.04.2012
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Year of Publication 25.04.2012
Patent
Leakage current mechanisms in sub-50nm recess-channel-type DRAM cell transistors with three-terminal gate-controlled diodes
Chung, Eun-Ae, Kim, Young-Pil, Nam, Kab-Jin, Lee, Sungsam, Min, Ji-Young, Shin, Yu-Gyun, Choi, Siyoung, Jin, Gyoyoung, Moon, Joo-Tae, Kim, Sangsig
Published in Solid-state electronics (01.02.2011)
Published in Solid-state electronics (01.02.2011)
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Journal Article
Investigation of spatial and energetic trap distributions in 1 nm EOT SiO 2/HfO 2 by discharging-sweep mode amplitude charge pumping
Chung, Eun-Ae, Nam, Kab-Jin, Kim, Young-Pil, Min, Ji-Young, Cho, Moonju, Hong, Hyungseok, Han, Jeong, Lee, Jae-Duk, Shin, Yu-Gyun, Choi, Siyoung, Kim, Sangsig
Published in Solid state sciences (2011)
Published in Solid state sciences (2011)
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Journal Article