by Kidan Bae, Minjung Jin, Hajin Lim, Lira Hwang, Dongseok Shin, Junekyun Park, Jinchul Heo, Jongho Lee, Jinho Do, Ilchan Bae, Chulhee Jeon, Jongwoo Park
Published in 2011 International Reliability Physics Symposium (01.04.2011)

by Kim, Young-Ju, Kwon, Hye-Jung, Doo, Su-Yeon, Ahn, Minsu, Kim, Yong-Hun, Lee, Yong-Jae, Kang, Dong-Seok, Do, Sung-Geun, Lee, Chang-Yong, Cho, Gun-Hee, Park, Jae-Koo, Kim, Jae-Sung, Park, Kyungbae, Oh, Seunghoon, Lee, Sang-Yong, Yu, Ji-Hak, Yu, Kihun, Jeon, Chulhee, Kim, Sang-Sun, Park, Hyun-Soo, Lee, Jeong-Woo, Cho, Seung-Hyun, Park, Keon-Woo, Kim, Yongjun, Seo, Young-Hun, Shin, Chang-Ho, Lee, Chan-Yong, Bang, Sam-Young, Park, Younsik, Choi, Seouk-Kyu, Kim, Byung-Cheol, Han, Gong-Heum, Bae, Seung-Jun, Kwon, Hyuk-Jun, Choi, Jung-Hwan, Sohn, Young-Soo, Park, Kwang-Il, Jang, Seong-Jin, Jin, Gyoyoung
Published in IEEE journal of solid-state circuits (01.01.2019)

by JEON, Chulhee, PARK, Sungho, KANG, Younggu, LIM, Inho
Year of Publication 04.07.2024