Effects of internal stresses on the mechanical properties of deposition thin films
Chuang, C.T., Chao, C.K., Chang, R.C., Chu, K.Y.
Published in Journal of materials processing technology (26.05.2008)
Published in Journal of materials processing technology (26.05.2008)
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Journal Article
The impact of gate-oxide breakdown on SRAM stability
Rodriguez, R., Stathis, J.H., Linder, B.P., Kowalczyk, S., Chuang, C.T., Joshi, R.V., Northrop, G., Bernstein, K., Bhavnagarwala, A.J., Lombardo, S.
Published in IEEE electron device letters (01.09.2002)
Published in IEEE electron device letters (01.09.2002)
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Journal Article
On the punchthrough characteristics of advanced self-aligned bipolar transistors
Chuang, C.T., Tang, D.D.-L., Li, G.P., Hackbarth, E.
Published in IEEE transactions on electron devices (01.07.1987)
Published in IEEE transactions on electron devices (01.07.1987)
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Journal Article
Leakage power analysis of 25-nm double-gate CMOS devices and circuits
Keunwoo Kim, Das, K.K., Joshi, R.V., Ching-Te Chuang
Published in IEEE transactions on electron devices (01.05.2005)
Published in IEEE transactions on electron devices (01.05.2005)
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Journal Article
Design considerations of SOI digital CMOS VLSI
Chuang, C.T.
Published in 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) (1998)
Published in 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) (1998)
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Conference Proceeding
Accurate Modeling and Analysis of Currents in Trapezoidal FinFET Devices
Rao, R., Bansal, A., Kim, J., Roy, K., Chuang, C.T.
Published in 2007 IEEE International SOI Conference (01.10.2007)
Published in 2007 IEEE International SOI Conference (01.10.2007)
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Conference Proceeding
A tri-state body charge modulated SOI sense amplifier
Kuang, J.B., Chuang, C.T.
Published in 2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207) (2001)
Published in 2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207) (2001)
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Conference Proceeding
Thermal stresses in a viscoelastic three-phase composite cylinder
Chao, C.K., Chuang, C.T., Chang, R.C.
Published in Theoretical and applied fracture mechanics (01.12.2007)
Published in Theoretical and applied fracture mechanics (01.12.2007)
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Journal Article
Hysteresis effect in pass-transistor based partially-depleted SOI CMOS circuits
Puri, R., Chuang, C.T.
Published in 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) (1998)
Published in 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) (1998)
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Conference Proceeding
Influence and model of gate oxide breakdown on CMOS inverters
Rodrı́guez, R., Stathis, J.H., Linder, B.P., Joshi, R.V., Chuang, C.T.
Published in Microelectronics and reliability (01.09.2003)
Published in Microelectronics and reliability (01.09.2003)
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Journal Article
Leakage Analysis for FinFET Devices using Self-Consistent Electro-Thermal Modeling
Kumar, S., Joshi, R.V., Chuang, C.T., Kim, K., Murthy, J.Y.
Published in 2007 IEEE International Conference on Integrated Circuit Design and Technology (01.05.2007)
Published in 2007 IEEE International Conference on Integrated Circuit Design and Technology (01.05.2007)
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Conference Proceeding
Direct temperature measurement for VLSI circuits and 3-D modeling of self-heating in sub-0.13 /spl mu/m SOI technologies
Joshi, R.V., Kang, S.S., Zamclmar, N., Mocuta, A., Chuang, C.T., Pascual-Gutierrez, J.A.
Published in 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design (2005)
Published in 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design (2005)
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Conference Proceeding
A high-performance body-charge-modulated SOI sense amplifier
Kuang, J.B., Allen, D.H., Chuang, C.T.
Published in 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) (2000)
Published in 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) (2000)
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Conference Proceeding