Synthesis and characterization of Tm2O3-doped Lu2O3 nanoparticle suitable for fabrication of thulium-doped laser fiber
Ghosh, Debanwee, Choudhury, Nilotpal, Balaji, S., Dana, Kausik, Dhar, Anirban
Published in Journal of materials science. Materials in electronics (01.02.2021)
Published in Journal of materials science. Materials in electronics (01.02.2021)
Get full text
Journal Article
Modeling of DC - AC NBTI Stress - Recovery Time Kinetics in P-Channel Planar Bulk and FDSOI MOSFETs and FinFETs
Choudhury, Nilotpal, Parihar, Narendra, Goel, Nilesh, Thirunavukkarasu, A., Mahapatra, Souvik
Published in IEEE journal of the Electron Devices Society (2020)
Published in IEEE journal of the Electron Devices Society (2020)
Get full text
Journal Article
Modeling and Analysis of PBTI, and HCD in Presence of Self-Heating in GAA-SNS NFETs
Choudhury, Nilotpal, Mahapatra, Souvik
Published in IEEE transactions on electron devices (01.12.2022)
Published in IEEE transactions on electron devices (01.12.2022)
Get full text
Journal Article
Multimode Mamyshev oscillator
Haig, Henry, Sidorenko, Pavel, Dhar, Anirban, Choudhury, Nilotpal, Sen, Ranjan, Christodoulides, Demetrios, Wise, Frank
Published in Optics letters (01.01.2022)
Published in Optics letters (01.01.2022)
Get more information
Journal Article
A Comprehensive Framework for the Self-Heat Enhanced BTI and HCD Isolation
Saikia, Rashmi, Choudhury, Nilotpal, Bisht, Arnav Shaurya, Mahapatra, Souvik
Published in IEEE transactions on electron devices (01.11.2024)
Published in IEEE transactions on electron devices (01.11.2024)
Get full text
Journal Article
A Generic Framework for MOSFET Reliability-Part II: Gate and Drain Stress-HCD
Mahapatra, Souvik, Diwakar, Himanshu, Thakor, Karansingh, Choudhury, Nilotpal, Chatterjee, Payel, Kumar, Satyam, Singhal, Udit, Sharma, Uma
Published in IEEE transactions on electron devices (01.01.2024)
Published in IEEE transactions on electron devices (01.01.2024)
Get full text
Journal Article
Comparative analysis of NBTI modeling frameworks BAT and Comphy
Ansari, Aseer Israr, Choudhury, Nilotpal, Parihar, Narendra, Mahapatra, Souvik
Published in Solid-state electronics (01.02.2023)
Published in Solid-state electronics (01.02.2023)
Get full text
Journal Article
Analysis of The Hole Trapping Detrapping Component of NBTI Over Extended Temperature Range
Choudhury, Nilotpal, Parihar, Narendra, Mahapatra, Souvik
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Get full text
Conference Proceeding
Unraveling the Dynamics of Charge Trapping and De-Trapping in Ferroelectric FETs
Deng, Shan, Zhao, Zijian, Kim, You Sung, Duenkel, Stefan, MacMahon, David, Tiwari, Ravi, Choudhury, Nilotpal, Beyer, Sven, Gong, Xiao, Kurinec, Santosh, Ni, Kai
Published in IEEE transactions on electron devices (01.03.2022)
Published in IEEE transactions on electron devices (01.03.2022)
Get full text
Journal Article
A Physical Model for Bulk Gate Insulator Trap Generation During Bias-Temperature Stress in Differently Processed p-Channel FETs
Samadder, Tarun, Choudhury, Nilotpal, Kumar, Satyam, Kochar, Dimple, Parihar, Narendra, Mahapatra, Souvik
Published in IEEE transactions on electron devices (01.02.2021)
Published in IEEE transactions on electron devices (01.02.2021)
Get full text
Journal Article
A Generic Trap Generation Framework for MOSFET Reliability-Part I: Gate Only Stress-BTI, SILC, and TDDB
Mahapatra, Souvik, Ansari, Aseer, Bisht, Arnav Shaurya, Choudhury, Nilotpal, Parihar, Narendra, Chatterjee, Payel, Gholve, Prasad, Tiwari, Ravi, Kumar, Satyam, Samadder, Tarun
Published in IEEE transactions on electron devices (01.01.2024)
Published in IEEE transactions on electron devices (01.01.2024)
Get full text
Journal Article
Decoupling of NBTI and Pure HCD Contributions in p-GAA SNS FETs Under Mixed VG/VD Stress
Choudhury, Nilotpal, Ranjan, Ayush, Mahapatra, Souvik
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Get full text
Conference Proceeding
In situ growth of AuNPs with a nanocavity on the surface of optical fibre for development of SPR sensor
Ghosh, Sudipta, Choudhury, Nilotpal, Dutta, Debjit, Mondal, Dhananjoy, Chandra Paul, Mukul, Das, Sukhen, Dhar, Anirban
Published in Ceramics international (15.09.2023)
Published in Ceramics international (15.09.2023)
Get full text
Journal Article
Synthesis and characterization of Yb3+ activated Lu2O3 nanoparticles doped optical fiber preform for high power laser application
Karmakar, Dipanjan, Choudhury, Nilotpal, Khan, Sultan, Dana, Kausik, Annapurna, Kalyandurg, Jain, Deepak, Paul, Mukul Chandra, Dhar, Anirban
Published in Ceramics international (15.04.2023)
Published in Ceramics international (15.04.2023)
Get full text
Journal Article
Novel Dopant Tailored Fibers Using Vapor Phase Chelate Delivery Technique
Choudhury, Nilotpal, Chowdhury, Sajib, Das Chowdhury, Sourav, Kumar Shekhar, Nishant, Jain, Deepak, Sen, Ranjan, Dhar, Anirban
Published in Physica status solidi. A, Applications and materials science (01.01.2022)
Published in Physica status solidi. A, Applications and materials science (01.01.2022)
Get full text
Journal Article
Analysis of Sheet Dimension (W, L) Dependence of NBTI in GAA-SNS FETs
Choudhury, Nilotpal, Samadder, Tarun, Tiwari, Ravi, Zhou, Huimei, Southwick, Richard G., Wang, Miaomiao, Mahapatra, Souvik
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Get full text
Conference Proceeding