Blood gene expression signatures predict exposure levels
Bushel, P.R, Heinloth, A.N, Li, J, Huang, L, Chou, J.W, Boorman, G.A, Malarkey, D.E, Houle, C.D, Ward, S.M, Wilson, R.E, Fannin, R.D, Russo, M.W, Watkins, P.B, Tennant, R.W, Paules, R.S
Published in Proceedings of the National Academy of Sciences - PNAS (13.11.2007)
Published in Proceedings of the National Academy of Sciences - PNAS (13.11.2007)
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Journal Article
Interface trap effect on gate induced drain leakage current in submicron N-MOSFET's
Wang, T., Chimoon Huang, Chang, T.E., Chou, J.W., Chang, C.Y.
Published in IEEE transactions on electron devices (01.12.1994)
Published in IEEE transactions on electron devices (01.12.1994)
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Journal Article
Genomic indicators in the blood predict drug-induced liver injury
Huang, J, Shi, W, Zhang, J, Chou, J W, Paules, R S, Gerrish, K, Li, J, Luo, J, Wolfinger, R D, Bao, W, Chu, T-M, Nikolsky, Y, Nikolskaya, T, Dosymbekov, D, Tsyganova, M O, Shi, L, Fan, X, Corton, J C, Chen, M, Cheng, Y, Tong, W, Fang, H, Bushel, P R
Published in The pharmacogenomics journal (01.08.2010)
Published in The pharmacogenomics journal (01.08.2010)
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A novel 0.25 /spl mu/m shallow trench isolation technology
Chen, C., Chou, J.W., Lur, W., Sun, S.W.
Published in International Electron Devices Meeting. Technical Digest (1996)
Published in International Electron Devices Meeting. Technical Digest (1996)
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Conference Proceeding
Optimization of short channel effect by arsenic P-Halo implant through polysilicon gate for 0.12 um P-MOSFET
Chen, C., Chang, C.Y., Chou, J.W., Huang, C.T., Lin, K.C., Yao-Chin Cheng, Chih-Yung Lin
Published in Proceedings 2000 IEEE Hong Kong Electron Devices Meeting (Cat. No.00TH8503) (2000)
Published in Proceedings 2000 IEEE Hong Kong Electron Devices Meeting (Cat. No.00TH8503) (2000)
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Conference Proceeding
Lateral field enhanced band-trap-band tunneling current in a 0.5/spl mu/m "OFF" state MOSFET
Wang, T., Huang, C., Chang, T.E., Chou, J.W., Chang, C.Y.
Published in 52nd Annual Device Research Conference (1994)
Published in 52nd Annual Device Research Conference (1994)
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Conference Proceeding
Optimization of short channel effect by arsenic P-halo implant through polysilicon gate for 0.12 um P-MOSFET
Chou, J.W., Hong, G., Lin, K.C., Cheng, Y.C., Chen, C., Chang, C.Y.
Published in 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) (2000)
Published in 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) (2000)
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Conference Proceeding
Advanced 0.25-0.18 /spl mu/m fully-planarized 6-level-interconnect CMOS technology for foundry manufacturing
Lin, T., Chen, C., Hsu, S.Y., Tsai, M.J., Yew, T.R., Chou, J.W., Huang, K.T., Wu, J.Y., Ku, Y.C., Liu, C.C., Yang, M.S., Yeh, W.K., Huang, C.H., Lur, W., Huang, H.S., Sun, S.W.
Published in 1998 Semiconductor Manufacturing Technology Workshop (Cat. No.98EX133) (1998)
Published in 1998 Semiconductor Manufacturing Technology Workshop (Cat. No.98EX133) (1998)
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Conference Proceeding
A fully planarized 6-level-metal CMOS technology for 0.25-0.18 micron foundry manufacturing
Lin, T., Chen, C., Hsu, S.Y., Tsai, M.J., Yew, T.R., Chou, J.W., Haung, K.T., Wu, J.Y., Ku, Y.C., Liu, C.C., Yang, M.S., Yeh, W.K., Huang, C.H., Lur, W., Huang, H.S., Sun, S.W.
Published in International Electron Devices Meeting. IEDM Technical Digest (1997)
Published in International Electron Devices Meeting. IEDM Technical Digest (1997)
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