In situ electrical and mechanical study of Indium Tin Oxide films deposited on polyimide substrate by Xe ion beam sputtering
Chommaux, T., Renault, P.O., Thiaudière, D., Godard, P., Paumier, F., Girardeau, T., Hurand, S., Goudeau, PH
Published in Thin solid films (01.01.2022)
Published in Thin solid films (01.01.2022)
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