Monte Carlo Simulation Study of Local Critical Dimension Error on Mask and Wafer
Ahn, Byoung-sup, Park, Joon-Soo, Choi, Seong-Woon, Sohn, Jung-Min
Published in Japanese Journal of Applied Physics (01.06.2004)
Published in Japanese Journal of Applied Physics (01.06.2004)
Get full text
Journal Article
Prospective Analysis of TERT Promoter Mutations in Papillary Thyroid Carcinoma at a Single Institution
Choi, Yun-Suk, Choi, Seong-Woon, Yi, Jin-Wook
Published in Journal of clinical medicine (18.05.2021)
Published in Journal of clinical medicine (18.05.2021)
Get full text
Journal Article
Process and chamber health monitoring of plasma enhanced ti deposition process through high performance VI-probe
Kye Hyun Baek, Coonan, B., Carbery, M., Jinkyung Joo, Hyunsoo Woo, Tae Soon Lee, Hyeon Soo An, Yoonbon Koo, Cheonsu Han, Sungho Han, Yongjin Kim, Seong Woon Choi, Woosung Han
Published in 2007 International Symposium on Semiconductor Manufacturing (01.10.2007)
Published in 2007 International Symposium on Semiconductor Manufacturing (01.10.2007)
Get full text
Conference Proceeding
MASK AND MANUFACTURING FOR LIQUID CRYSTAL DISPLAY USING THE SAME
KIM, BONG YEON, KIM, SOON YOUNG, KIM, IN HO, HAN, CHUNG HEON, KANG, MIN, SON, YONG, KANG, SUNG MO, PARK, SOO JIN, LEE, MIN JEE, JUNG, YUN KU, KIM, KEUN HA, CHOI, SEONG WOON, JEONG, HYE RAN, RYU, JONG HYOEK
Year of Publication 04.08.2016
Get full text
Year of Publication 04.08.2016
Patent
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING UNIFIED OPTICAL PROXIMITY CORRECTION
SHIM, SEONG BO, CHOI, SEONG WOON, SUH, CHUN SUK, KIM, SANG WOOK, SER, JUNG HOON, JEONG, MOON GYU
Year of Publication 27.10.2011
Get full text
Year of Publication 27.10.2011
Patent