by Holmes, Mark J, Choi, Kihyun, Kako, Satoshi, Arita, Munetaka, Arakawa, Yasuhiko
Published in Nano letters (12.02.2014)

by Choi, Kihyun, Arita, Munetaka, Arakawa, Yasuhiko
Published in Journal of crystal growth (15.10.2012)

by Holmes, Mark J, Kako, Satoshi, Choi, Kihyun, Arita, Munetaka, Arakawa, Yasuhiko
Published in ACS photonics (20.04.2016)

by Choi, Kihyun, Arita, Munetaka, Kako, Satoshi, Arakawa, Yasuhiko
Published in Journal of crystal growth (01.05.2013)

by Holmes, Mark J, Kako, Satoshi, Choi, Kihyun, Podemski, Pawel, Arita, Munetaka, Arakawa, Yasuhiko
Published in Nano letters (11.02.2015)

by Holmes, Mark J, Kako, Satoshi, Choi, Kihyun, Podemski, Pawel, Arita, Munetaka, Arakawa, Yasuhiko
Published in Japanese Journal of Applied Physics (01.08.2013)

by 최기현(Kihyun Choi), 김용성(Yongseong Kim), 이행우(Henagwoo Lee), 서장후(Janghoo Seo)
Published in 설비공학 논문집, 27(1) (2015)

by Jiang, Hai, Jeong, Taeyoung, Sagong, Hyunchul, Choi, Kihyun, Jin, Minjung, Yeo, Myungsoo, Rhee, Hwasung, Lee, Euncheol
Published in 2020 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2020)

by Choi, Kihyun, Shim, Hyewon, Park, Junekyun, Cho, Youngwoo, Rhee, Hwasung, Pae, Sangwoo, Sagong, Hyun Chul, Kang, Wonchang, Kim, Hyunjin, Hai, Jiang, Lee, Miji, Kim, Bomi, Lee, Mi-Ji, Lee, Soonyoung
Published in IEEE transactions on electron devices (01.12.2019)

by Jiang, Hai, Kim, Jinju, Choi, Kihyun, Shim, Hyewon, Sagong, Hyunchul, Park, Junekyun, Rhee, Hwasung, Lee, Euncheol
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)

by Kim, Seongkyung, Jung, Ukjin, Choo, Seungjin, Choi, Kihyun, Chung, Taejin, Chung, Shinyoung, Lee, Euncheol, Park, Juhun, Bae, Deokhan, Um, Myungyoon
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)

by KIM JOOYOUNG, KIM JIHONG, CHOI KIHYUN, KANG HEEYOUB, BANG KWANGKYU, KIM MINSEOK
Year of Publication 20.10.2022

by Mahmud, Md Iqbal, Ranjan, Rakesh, Lee, Ki-Don, Perepa, Pavitra Ramadevi, Dongkyun Kwon, Caleb, Choo, Seungjin, Choi, Kihyun
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)

by Choi, Kihyun, Sagong, Hyun Chul, Kang, Wonchang, Kim, Hyunjin, Hai, Jiang, Lee, Miji, Kim, Bomi, Lee, Mi-ji, Lee, Soonyoung, Shim, Hyewon, Park, Junekyun, Cho, Youngwoo, Rhee, Hwasung, Pae, Sangwoo
Published in 2019 Symposium on VLSI Technology (01.06.2019)

by Choi, Kihyun, Kim, Yongseong, Lee, Henagwoo, Seo, Janghoo
Published in Korean Journal of Air-Conditioning and Refrigeration Engineering (10.01.2015)

by Sagong, Hyun Chul, Choi, Kihyun, Jiang, Hai, Park, Junekyun, Rhee, Hwasung, Pae, Sangwoo
Published in 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (01.04.2020)

by Choi, Kihyun, Jeong, Taeyoung, Kim, Jinju, Choo, Seungjin, Kim, Younghan, Yeo, Myung Soo, Lee, Miji, Kim, Jinseok, Lee, Euncheol
Published in 2021 IEEE International Interconnect Technology Conference (IITC) (06.07.2021)

by Choi, Kihyun, Sagong, Hyun Chul, Jin, Minjung, Hai, Jiang, Lee, Miji, Jeong, Taeyoung, Yeo, Myung Soo, Shim, Hyewon, Ahn, Da, Kim, Wooyeon, Kim, Yongjeung, Park, JuneKyun, Rhee, Hwasung, Lee, Euncheol
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)

by BANG, KWANGKYU, KIM, JOOYOUNG, KIM, MINSEOK, CHOI, KIHYUN, KIM, JIHONG, KANG, HEEYOUB
Year of Publication 13.10.2022

by Mun, Hyunsu, Choi, Kihyun, Kim, Jinhyeok, Cho, Isung, Na, Jeasung, Park, Hanul, Kim, Seungtae, Lee, Youngseok, Siebers, Zachary, Rausch, Sarah, Springer, John
Published in 2018 IEEE International Conference on Consumer Electronics - Asia (ICCE-Asia) (01.06.2018)