A 10 nm FinFET 128 Mb SRAM With Assist Adjustment System for Power, Performance, and Area Optimization
Song, Taejoong, Rim, Woojin, Park, Sunghyun, Kim, Yongho, Yang, Giyong, Kim, Hoonki, Baek, Sanghoon, Jung, Jonghoon, Kwon, Bongjae, Cho, Sungwee, Jung, Hyuntaek, Choo, Yongjae, Choi, Jaeseung
Published in IEEE journal of solid-state circuits (01.01.2017)
Published in IEEE journal of solid-state circuits (01.01.2017)
Get full text
Journal Article
A 7nm FinFET SRAM using EUV lithography with dual write-driver-assist circuitry for low-voltage applications
Taejoong Song, Jonghoon Jung, Woojin Rim, Hoonki Kim, Yongho Kim, Changnam Park, Jeongho Do, Sunghyun Park, Sungwee Cho, Hyuntaek Jung, Bongjae Kwon, Hyun-Su Choi, JaeSeung Choi, Jong Shik Yoon
Published in 2018 IEEE International Solid - State Circuits Conference - (ISSCC) (01.02.2018)
Published in 2018 IEEE International Solid - State Circuits Conference - (ISSCC) (01.02.2018)
Get full text
Conference Proceeding
Grey-Box Concolic Testing on Binary Code
Choi, Jaeseung, Jang, Joonun, Han, Choongwoo, Cha, Sang Kil
Published in 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE) (01.05.2019)
Published in 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE) (01.05.2019)
Get full text
Conference Proceeding
SMARTIAN: Enhancing Smart Contract Fuzzing with Static and Dynamic Data-Flow Analyses
Choi, Jaeseung, Kim, Doyeon, Kim, Soomin, Grieco, Gustavo, Groce, Alex, Cha, Sang Kil
Published in 2021 36th IEEE/ACM International Conference on Automated Software Engineering (ASE) (01.11.2021)
Published in 2021 36th IEEE/ACM International Conference on Automated Software Engineering (ASE) (01.11.2021)
Get full text
Conference Proceeding
NtFuzz: Enabling Type-Aware Kernel Fuzzing on Windows with Static Binary Analysis
Choi, Jaeseung, Kim, Kangsu, Lee, Daejin, Cha, Sang Kil
Published in 2021 IEEE Symposium on Security and Privacy (SP) (01.05.2021)
Published in 2021 IEEE Symposium on Security and Privacy (SP) (01.05.2021)
Get full text
Conference Proceeding
A 32Mb Embedded Flash Memory based on 28nm with the best Cell Efficiency and Robust Design achievement featuring 13.48Mb/mm2 at 0.85V
Shin, Hyunjin, Won, Sangkyung, Kim, Dohui, Choi, Byunghun, Kim, Gyusung, Oh, Myeonghee, Choi, Jaeseung, Kye, Jongwook
Published in 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (12.06.2022)
Published in 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (12.06.2022)
Get full text
Conference Proceeding
A 14nm 128Mb Embedded MRAM Macro achieved the Best Figure-Of-Merit with 80MHz Read operation and 18.1Mb/mm² implementation at 0.64V
Kang, Gyuseong, Shin, Hyunjin, Jung, Hyuntaek, Lee, Sunkyu, Choi, Jaeseung, Baek, Sangyeop, Jung, Hyunsung, Kim, Daeshik, Hwang, Sohee, Han, Shinhee, Ji, Yongsung, Yoon, Sei Seung
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Get full text
Conference Proceeding
AN ELECTRONIC DEVICE INCLUDING A SENSOR MOUNTED BELOW A DISPLAY PANEL
HER YONG KOO, CHOI JAESEUNG, SHIN HYUNCHANG, YANG BYUNG DUK, LEE JOON GYU, JUNG SONG HEE
Year of Publication 16.04.2020
Get full text
Year of Publication 16.04.2020
Patent
24.3 A Voltage and Temperature Tracking SRAM Assist Supporting 740mV Dual-Rail Offset for Low-Power and High-Performance Applications in 7nm EUV FinFET Technology
Lee, Inhak, Jeong, Hanwool, Baeck, Sangyeop, Gupta, Siddharth, Park, Changnam, Seo, Dongwook, Choi, Jaesung, Kim, Jaeyoung, Kim, Hoon, Kang, Jungmyung, Jang, Sunyung, Moon, Daeyoung, Han, Sangshin, Kim, Taehyung, Lim, Jaehyun, Park, Younghwan, Hwang, Hyejin, Kang, Jeonseung, Choi, Jaeseung, Song, Taejoong
Published in 2019 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2019)
Published in 2019 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2019)
Get full text
Conference Proceeding
12.2 A 7nm FinFET SRAM macro using EUV lithography for peripheral repair analysis
Taejoong Song, Hoonki Kim, Woojin Rim, Yongho Kim, Sunghyun Park, Changnam Park, Minsun Hong, Giyong Yang, Jeongho Do, Jinyoung Lim, Seungyoung Lee, Ingyum Kim, Sanghoon Baek, Jonghoon Jung, Daewon Ha, Hyungsoon Jang, Taejung Lee, Chul-Hong Park, Bongjae Kwon, Hyuntaek Jung, Sungwee Cho, Yongjae Choo, JaeSeung Choi
Published in 2017 IEEE International Solid-State Circuits Conference (ISSCC) (01.02.2017)
Published in 2017 IEEE International Solid-State Circuits Conference (ISSCC) (01.02.2017)
Get full text
Conference Proceeding
17.1 A 10nm FinFET 128Mb SRAM with assist adjustment system for power, performance, and area optimization
Taejoong Song, Woojin Rim, Sunghyun Park, Yongho Kim, Jonghoon Jung, Giyong Yang, Sanghoon Baek, Jaeseung Choi, Bongjae Kwon, Yunwoo Lee, Sungbong Kim, Gyuhong Kim, Hyo-Sig Won, Ja-Hum Ku, Paak, Sunhom Steve, Es Jung, Park, Steve Sungho, Kinam Kim
Published in 2016 IEEE International Solid-State Circuits Conference (ISSCC) (01.01.2016)
Published in 2016 IEEE International Solid-State Circuits Conference (ISSCC) (01.01.2016)
Get full text
Conference Proceeding
A 28nm Embedded Flash Memory with 100MHz Read Operation and 7.42Mb/mm2 at 0.85V featuring for Automotive Application
Shin, Hyunjin, Oh, Myeonghee, Choi, Jaeseung, Song, Taejoong, Kye, Jongwook
Published in 2021 Symposium on VLSI Circuits (13.06.2021)
Published in 2021 Symposium on VLSI Circuits (13.06.2021)
Get full text
Conference Proceeding
INTEGRATED CIRCUIT DEVICES
CHEON, Sangjoon, CHOI, Jaeseung, KANG, Heewon, KIM, Byungsu, PARK, Sunhee
Year of Publication 21.03.2024
Get full text
Year of Publication 21.03.2024
Patent