Direct Observation of Trace Elements in Barium Titanate of Multilayer Ceramic Capacitors Using Atom Probe Tomography
Jang, Kyuseon, Kim, Mi-Yang, Jung, Chanwon, Kim, Se-Ho, Choi, Daechul, Park, Seong-Chan, Scheu, Christina, Choi, Pyuck-Pa
Published in Microscopy and microanalysis (04.05.2024)
Published in Microscopy and microanalysis (04.05.2024)
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Journal Article
A new physical model for life time prediction of Pb-free solder joints in electromigration tests
Tian Tian, Gusak, A. M., Liashenko, O. Y., Jung-Kyu Han, Daechul Choi, King-Ning Tu
Published in 2012 IEEE 62nd Electronic Components and Technology Conference (01.05.2012)
Published in 2012 IEEE 62nd Electronic Components and Technology Conference (01.05.2012)
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Conference Proceeding