A 90 nm 1.8 V 512 Mb Diode-Switch PRAM With 266 MB/s Read Throughput
LEE, Kwang-Jin, CHO, Beak-Hyung, PARK, Mu-Hui, RO, Yu-Hwan, CHOI, Joon-Yong, KIM, Ki-Sung, KIM, Young-Ran, SHIN, In-Cheol, LIM, Ki-Won, CHO, Ho-Keun, CHOI, Chang-Han, CHUNG, Won-Ryul, CHO, Woo-Yeong, KIM, Du-Eung, YOON, Yong-Jin, YU, Kwang-Suk, JEONG, Gi-Tae, JEONG, Hong-Sik, KWAK, Choong-Keun, KIM, Chang-Hyun, KIM, Kinam, KANG, Sangbeom, CHOI, Byung-Gil, OH, Hyung-Rok, LEE, Chang-Soo, KIM, Hye-Jin, PARK, Joon-Min, QI WANG
Published in IEEE journal of solid-state circuits (01.01.2008)
Published in IEEE journal of solid-state circuits (01.01.2008)
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Journal Article
Conference Proceeding
PHASE-CHANGE RANDOM ACCESS MEMORY, REDUNDANCY CELL TEST METHOD AND ACCESS METHOD THEREOF
KIM, KI SUNG, CHOI, CHANG HAN, CHO, HO KEUN, SEO, JONG SOO, CHOI, BYUNG GIL, PARK, JONG CHUL
Year of Publication 13.07.2009
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Year of Publication 13.07.2009
Patent
A 58nm 1.8V 1Gb PRAM with 6.4MB/s program BW
Hoeju Chung, Byung Hoon Jeong, ByungJun Min, Youngdon Choi, Beak-Hyung Cho, Junho Shin, Jinyoung Kim, Jung Sunwoo, Joon-min Park, Qi Wang, Yong-jun Lee, Sooho Cha, Dukmin Kwon, Sangtae Kim, Sunghoon Kim, Yoohwan Rho, Mu-Hui Park, Jaewhan Kim, Ickhyun Song, Sunghyun Jun, Jaewook Lee, KiSeung Kim, Ki-won Lim, Won-ryul Chung, ChangHan Choi, HoGeun Cho, Inchul Shin, Woochul Jun, Seokwon Hwang, Ki-Whan Song, KwangJin Lee, Sang-whan Chang, Woo-Yeong Cho, Jei-Hwan Yoo, Young-Hyun Jun
Published in 2011 IEEE International Solid-State Circuits Conference (01.02.2011)
Published in 2011 IEEE International Solid-State Circuits Conference (01.02.2011)
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Conference Proceeding
A 90nm 1.8V 512Mb Diode-Switch PRAM with 266MB/s Read Throughput
Lee, Kwang-Jin, Cho, Beak-Hyung, Cho, Woo-Yeong, Kang, Sangbeom, Choi, Byung-Gil, Oh, Hyung-Rok, Lee, Chang-Soo, Kim, Hye-Jin, Park, Joon-Min, Wang, Qi, Park, Mu-Hui, Ro, Yu-Hwan, Choi, Joon-Yong, Kim, Ki-Sung, Kim, Young-Ran, Shin, In-Cheol, Lim, Ki-Won, Cho, Ho-Keun, Choi, Chang-Han, Chung, Won-Ryul, Kim, Du-Eung, Yu, Kwang-Suk, Jeong, Gi-Tae, Jeong, Hong-Sik, Kwak, Choong-Keun, Kim, Chang-Hyun, Kim, Kinam
Published in 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (01.02.2007)
Published in 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (01.02.2007)
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Conference Proceeding
Phase change random access memory and method of testing the same
Choi, Byung-gil, Cho, Beak-hyung, Kim, Du-eung, Choi, Chang-han, Ro, Yu-hwan
Year of Publication 11.08.2009
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Year of Publication 11.08.2009
Patent
Methods of operating phase-change random access memory devices
Choi, Chang-han, Cho, Ho-keun, Choi, Byung-gil, Kim, Ki-sung, Park, Jong-chul, Seo, Jong-soo
Year of Publication 07.12.2010
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Year of Publication 07.12.2010
Patent
PRAM and method of firing memory cells
Kim, Hye-jin, Lee, Kwang-jin, Kim, Du-eung, Cho, Woo-yeong, Choi, Chang-han, Lim, Ki-won
Year of Publication 29.06.2010
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Year of Publication 29.06.2010
Patent
Methods of operating phase-change random access memory devices
PARK JONGUL, KIM KI-SUNG, CHO HO-KEUN, CHOI CHANG-HAN, CHOI BYUNG-GIL, SEO JONG-SOO
Year of Publication 07.12.2010
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Year of Publication 07.12.2010
Patent
PRAM and method of firing memory cells
LIM KI-WON, CHO WOO-YEONG, KIM DU-EUNG, LEE KWANG-JIN, CHOI CHANG-HAN, KIM HYE-JIN
Year of Publication 29.06.2010
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Year of Publication 29.06.2010
Patent
Phase change random access memory and method of testing the same
KIM DU-EUNG, CHOI CHANG-HAN, CHOI BYUNG-GIL, CHO BEAK-HYUNG, RO YU-HWAN
Year of Publication 11.08.2009
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Year of Publication 11.08.2009
Patent
PHASE-CHANGE RANDOM ACCESS MEMORY DEVICES AND RELATED METHODS OF OPERATION
PARK JONGUL, KIM KI-SUNG, CHO HO-KEUN, CHOI CHANG-HAN, CHOI BYUNG-GIL, SEO JONG-SOO
Year of Publication 09.07.2009
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Year of Publication 09.07.2009
Patent
PRAM AND METHOD OF FIRING MEMORY CELLS
LIM KI-WON, CHO WOO-YEONG, KIM DU-EUNG, LEE KWANG-JIN, CHOI CHANG-HAN, KIM HYE-JIN
Year of Publication 08.05.2008
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Year of Publication 08.05.2008
Patent
TEST METHOD OF PHASE CHANGE RANDOM ACCESS MEMORY AND PHASE CHANGE RANDOM ACCESS MEMORY
CHOI, CHANG HAN, RO, YU HWAN, CHOI, BYUNG GIL, CHO, BEAK HYUNG, KIM, DU EUNG
Year of Publication 14.03.2008
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Year of Publication 14.03.2008
Patent
Phase change random access memory and method of testing the same
KIM DU-EUNG, CHOI CHANG-HAN, CHOI BYUNG-GIL, CHO BEAK-HYUNG, RO YU-HWAN
Year of Publication 13.03.2008
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Year of Publication 13.03.2008
Patent