Electrical extractions of 1-D doping profiles and effective mobility in MOSFET
Hyunho Park, Byoungdeok Choi
Published in 2010 10th IEEE International Conference on Solid Dielectrics (01.07.2010)
Published in 2010 10th IEEE International Conference on Solid Dielectrics (01.07.2010)
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Conference Proceeding
Electrical Extractions of One Dimensional Doping Profile and Effective Mobility for Metal--Oxide--Semiconductor Field-Effect Transistors
Park, Hyunho, Lee, Kong-soo, Baek, Dohuyn, Kang, Juseong, So, Byungse, Kwon, Seok Il, Choi, Byoungdeok
Published in Japanese Journal of Applied Physics (01.01.2011)
Published in Japanese Journal of Applied Physics (01.01.2011)
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Journal Article
Electrical Extractions of One Dimensional Doping Profile and Effective Mobility for Metal–Oxide–Semiconductor Field-Effect Transistors
Park, Hyunho, Lee, Kong-soo, Baek, Dohuyn, Kang, Juseong, So, Byungse, Kwon, Seok Il, Choi, Byoungdeok
Published in Japanese Journal of Applied Physics (01.01.2011)
Published in Japanese Journal of Applied Physics (01.01.2011)
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Journal Article
Improved evaluation of DRAM transistors and accurate resistance measurement for real chip contacts by nano-probing technique
Hyunho Park, Kyosuk Chae, Yamada, Satoru, Hyung-Suk Kuh, Byoungdeok Choi
Published in 2010 IEEE International Integrated Reliability Workshop Final Report (01.10.2010)
Published in 2010 IEEE International Integrated Reliability Workshop Final Report (01.10.2010)
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Conference Proceeding
A study on off-state leakage current characteristics of asymmetric-metal-oxide-semiconductor field-effect transistors
Seokil Kwon, Byoungseon Choi, Hyung-Suk Kuh, Hyunae Park, Byoungdeok Choi
Published in 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2011)
Published in 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2011)
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Conference Proceeding
A study on off-state leakage current characteristics of asymmetric-metal-oxide-semiconductor field-effect transistors
Seokil Kwon, Byoungseon Choi, Hyung-Suk Kuh, Hyunae Park, Byoungdeok Choi
Published in 11th International Workshop on Junction Technology (IWJT) (01.06.2011)
Published in 11th International Workshop on Junction Technology (IWJT) (01.06.2011)
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Conference Proceeding