Extracting Mobility Degradation and Total Series Resistance of Cylindrical Gate-All-Around Silicon Nanowire Field-Effect Transistors
Choi, Luryi, Hong, Byoung Hak, Jung, Young Chai, Cho, Keun Hwi, Yeo, Kyoung Hwan, Kim, Dong-Won, Jin, Gyo Young, Oh, Kyung Seok, Lee, Won-Seong, Song, Sang-Hun, Rieh, Jae Sung, Whang, Dong Mok, Hwang, Sung Woo
Published in IEEE electron device letters (01.06.2009)
Published in IEEE electron device letters (01.06.2009)
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Journal Article
24.3 A 3nm Gate-All-Around SRAM Featuring an Adaptive Dual-BL and an Adaptive Cell-Power Assist Circuit
Song, Taejoong, Rim, Woojin, Kim, Hoonki, Cho, Keun Hwi, Kim, Taeyeong, Lee, TaeJung, Bae, Geumjong, Kim, Dong-Won, Kwon, SD, Baek, Sanghoon, Jung, Jonghoon, Kye, Jongwook, Jung, Hakchul, Kim, Hyungtae, Jung, Soon-Moon, Park, Jaehong
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)
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Conference Proceeding
NEMS switch with 30 nm-thick beam and 20 nm-thick air-gap for high density non-volatile memory applications
Jang, Weon Wi, Yoon, Jun-Bo, Kim, Min-Sang, Lee, Ji-Myoung, Kim, Sung-Min, Yoon, Eun-Jung, Cho, Keun Hwi, Lee, Sung-Young, Choi, In-Hyuk, Kim, Dong-Won, Park, Donggun
Published in Solid-state electronics (01.10.2008)
Published in Solid-state electronics (01.10.2008)
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Conference Proceeding
Interface Trap Density of Gate-All-Around Silicon Nanowire Field-Effect Transistors With TiN Gate: Extraction and Compact Model
Najam, Faraz, Yun Seop Yu, Keun Hwi Cho, Kyoung Hwan Yeo, Dong-Won Kim, Jong Seung Hwang, Sansig Kim, Sung Woo Hwang
Published in IEEE transactions on electron devices (01.08.2013)
Published in IEEE transactions on electron devices (01.08.2013)
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Journal Article
Co-existence of Random Telegraph Noise and Single-Hole-Tunneling State in Gate-All-Around PMOS Silicon Nanowire Field-Effect-Transistors
Hong, Byoung-Hak, Lee, Seong-Joo, Hwang, Sung-Woo, Cho, Keun-Hwi, Yeo, Kyoung-Hwan, Kim, Dong-Won, Jin, Gyo-Young, Park, Dong-Gun
Published in Journal of semiconductor technology and science (2011)
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Published in Journal of semiconductor technology and science (2011)
Journal Article
Semiconductor device
CHO KEUN HWI, MASUOKA YURI, JEONG WON CHEOL, CHOI BYUNG HA, EOM BYEOL HAE, KIM SUNG WON
Year of Publication 29.04.2024
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Year of Publication 29.04.2024
Patent
Semiconductor device and method for manufacturing the same
CHO KEUN HWI, KIM DAEWON, KANG MYUNG GIL, PARK BEOMJIN, KIM DONGWON, SHIN JAEHOON
Year of Publication 05.04.2023
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Year of Publication 05.04.2023
Patent
High-Performance Twin Silicon Nanowire MOSFET (TSNWFET) on Bulk Si Wafer
Suk, Sung Dae, Yeo, Kyoung Hwan, Cho, Keun Hwi, Li, Ming, Yeoh, Yun Young, Lee, Sung-Young, Kim, Sung Min, Yoon, Eun Jung, Kim, Min Sang, Oh, Chang Woo, Kim, Sung Hwan, Kim, Dong-Won, Park, Donggun
Published in IEEE transactions on nanotechnology (01.03.2008)
Published in IEEE transactions on nanotechnology (01.03.2008)
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SEMICONDUCTOR DEVICE
KIM HYOJIN, CHO KEUN HWI, LEE SANGMOON, KANG MYUNG GIL, KIM JINBUM, PARK BEOMJIN, KIM DONGWON
Year of Publication 22.02.2023
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Year of Publication 22.02.2023
Patent
Semiconductor device and method of fabricating the same
CHO KEUN HWI, JEONG WON CHEOL, KWON TAE YONG, KIM YOON JOONG, PARK JI HOON, KIM SUNG WON
Year of Publication 28.12.2023
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Year of Publication 28.12.2023
Patent
Investigation of nanowire size dependency on TSNWFET
Sung Dae Suk, Ming Li, Yun Young Yeoh, Kyoung Hwan Yeo, Keun Hwi Cho, In Kyung Ku, Hong Cho, WonJun Jang, Dong-Won Kim, Donggun Park, Won-Seong Lee
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
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