60GHz Double-balanced drain-pumped up-conversion mixer using 90nm CMOS
Insang Song, Jaejin Lee, Chulwoo Byeon, Seongjun Cho, Hongyi Kim, Innyeal Oh, Chulsoon Park
Published in 2013 IEEE MTT-S International Microwave Symposium Digest (MTT) (01.06.2013)
Published in 2013 IEEE MTT-S International Microwave Symposium Digest (MTT) (01.06.2013)
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Conference Proceeding
Novel failure traces beyond the barrier on the floating device
Lee, Gwang Wook, Shim, Sunnu, Cho, Wookhyun, Kim, Wonse, Lee, Kisoo, Kim, Jaehyun, Cho, Seongjun, Won, Seokjun, Koo, Bonyoung
Published in Microelectronics and reliability (01.11.2020)
Published in Microelectronics and reliability (01.11.2020)
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Journal Article
Innovative approaches to the invisible defect on STT-MRAM
Lee, Gwang Wook, Ok, Euna, Heo, Suhaeng, Jeong, Daeeun, Lee, Joonmyoung, Shim, Sunnu, Kim, Wonse, Han, Yongwoon, Choi, Hunseong, Kim, Jae Hyun, Cho, Seongjun, Won, Seokjun, Kim, Jinsung
Published in Microelectronics and reliability (01.09.2019)
Published in Microelectronics and reliability (01.09.2019)
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Journal Article
Soft Defect Analysis on Advanced Logic Integrated Circuit by Dynamic Laser Stimulation
Kim, Beomjun, Kim, Juhyun, Cho, Wookhyun, Cho, Seongjun, Won, Seokjun, Kim, Jinsung
Published in 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2018)
Published in 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2018)
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Conference Proceeding