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"Cho, Min-Geon"
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"Cho, Min-Geon"
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Methods and systems for analyzing layouts of semiconductor integrated circuit devices
by
Bae, Choel-Hwyi
,
Baek, Gwang-Hyeon
,
Cho
,
Min
-
Geon
Year of Publication
21.09.2010
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Methods and systems for analyzing layouts of semiconductor integrated circuit devices
by
BAEK GWANG-HYEON
,
BAE CHOEL-HWYI
,
CHO MIN
-
GEON
Year of Publication
21.09.2010
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METHOD AND SYSTEM FOR ANALYZING LAYOUT OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
by
BAEK GWANG-HYEON
,
BAE CHOEL-HWYI
,
CHO MIN
-
GEON
Year of Publication
09.08.2007
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Methods and systems for analyzing layouts of semiconductor integrated circuit devices
by
BAEK GWANG-HYEON
,
BAE CHOEL-HWYI
,
CHO MIN
-
GEON
Year of Publication
26.07.2007
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Method and system for enhancing yield of semiconductor integrated circuit devices using systematic fault rate of hole
by
Bae, Choel-hwyi
,
Kwon, Sang-deok
,
Cho
,
Min
-
geon
,
Baek, Gwang-hyeon
Year of Publication
20.04.2010
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Method and system for enhancing yield of semiconductor integrated circuit devices using systematic fault rate of hole
by
BAEK GWANG-HYEON
,
KWON SANG-DEOK
,
BAE CHOEL-HWYI
,
CHO MIN
-
GEON
Year of Publication
20.04.2010
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METHOD FOR ANALYZING LAYOUT OF SEMICONDUCTOR INTEGRATE CIRCUIT DEVICE, SYSTEM FOR ANALYZING LAYOUT OF SEMICONDUCTOR INTEGRATE CIRCUIT DEVICE, STANDARD CELL LIBRARY, MASK AND SEMICONDUCTOR INTEGRATE CIRCUIT DEVICE
by
BAE, CHOEL HWYI
,
BAEK, GWANG HYEON
,
CHO
,
MIN GEON
Year of Publication
29.03.2007
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Method and system for enhancing yield of semiconductor integrated circuit devices using systematic fault rate of hole
by
BAEK GWANG-HYEON
,
KWON SANG-DEOK
,
BAE CHOEL-HWYI
,
CHO MIN
-
GEON
Year of Publication
02.08.2007
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METHOD FOR ENHANCING YIELD OF SEMICONDUCTOR INTEGRATE CIRCUIT DEVICE AND SYSTEM FOR THE SAME USING A HOLE'S SYSTEMATIC FAULT RATE
by
BAE, CHOEL HWYI
,
KWON, SANG DEOK
,
BAEK, GWANG HYEON
,
CHO
,
MIN GEON
Year of Publication
01.08.2007
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