HRPDviewer: human ribosome profiling data viewer
Wu, Wei-Sheng, Jiang, Yu-Xuan, Chang, Jer-Wei, Chu, Yu-Han, Chiu, Yi-Hao, Tsao, Yi-Hong, Nordling, Torbjörn E M, Tseng, Yan-Yuan, Tseng, Joseph T
Published in Database : the journal of biological databases and curation (01.01.2018)
Published in Database : the journal of biological databases and curation (01.01.2018)
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Journal Article
Design and Enhancement of ESD Reliability in Circular UHV 300-V nLDMOS Power Components
Shen-Li Chen, Yi-Hao Chao, Chih-Ying Yen, Jen-Hao Lo, Chun-Ting Kuo, Yu-Lin Lin, Yi-Hao Chiu, Pei-Lin Wu, Yu-Lin Jhou
Published in 2018 International Power Electronics Conference (IPEC-Niigata 2018 -ECCE Asia) (01.05.2018)
Published in 2018 International Power Electronics Conference (IPEC-Niigata 2018 -ECCE Asia) (01.05.2018)
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Conference Proceeding
Source-end design and failure study for ESD enhancement of 60 V nLDMOS devices
Shen-Li Chen, Yi-Cih Wu, Chih-Hung Yang, Chih-Ying Yen, Kuei-Jyun Chen, Jia-Ming Lin, Yi-Hao Chiu, Yu-Lin Lin, Chun-Ting Kuo, Jen-Hao Lo, Yi-Hao Chao, Hung-Wei Chen
Published in 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2017)
Published in 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2017)
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Conference Proceeding
Investigate exact reliability under limited time and space of a multistate online food delivery network
Nguyen, Thi-Phuong, Lin, Yi-Kuei, Chiu, Yi-Hao
Published in Expert systems with applications (01.03.2023)
Published in Expert systems with applications (01.03.2023)
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Journal Article
NBL Layer Impacts on ESD Reliability for 60- V Power pLDMOS Transistors
Chen, Shen-Li, Chiu, Yi-Hao, Yang, Chih-Hung, Kuo, Chun-Ting, Lin, Yu-Lin, Chao, Yi-Hao, Lo, Jen-Hao, Jhou, Yu-Lin, Wu, Pei-Lin
Published in 2018 IEEE International Conference on Consumer Electronics-Taiwan (ICCE-TW) (01.05.2018)
Published in 2018 IEEE International Conference on Consumer Electronics-Taiwan (ICCE-TW) (01.05.2018)
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Conference Proceeding
An upgrade of ESD-reliability in HV 60-V nLDMOS-SCR devices by the discrete anode
Chen, Shen-Li, Lin, Yu-Lin, Wu, Yi-Cih, Chao, Yi-Hao, Chiu, Yi-Hao, Wu, Pei-Lin, Jhou, Yu-Lin, Kuo, Chun-Ting, Lo, Jen-Hao
Published in 2018 7th International Symposium on Next Generation Electronics (ISNE) (01.05.2018)
Published in 2018 7th International Symposium on Next Generation Electronics (ISNE) (01.05.2018)
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Conference Proceeding
ESD-improvement comparisons of HV n-/p-LDMOS components by the bulk modulations
Shen-Li Chen, Kuei-Jyun Chen, Yi-Cih Wu, Chih-Hung Yang, Yu-Lin Lin, Yi-Hao Chiu, Chih-Ying Yen, Yi-Hao Chao, Chun-Ting Kuo, Jia-Ming Lin, Jen-Hao Lo
Published in 2017 IEEE 3rd International Future Energy Electronics Conference and ECCE Asia (IFEEC 2017 - ECCE Asia) (01.06.2017)
Published in 2017 IEEE 3rd International Future Energy Electronics Conference and ECCE Asia (IFEEC 2017 - ECCE Asia) (01.06.2017)
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Conference Proceeding
ESD-immunity evaluations of a 40 V nLDMOS with embedded SCRs in the drain side
Shen-Li Chen, Chih-Ying Yen, Chih-Hung Yang, Yi-Cih Wu, Kuei-Jyun Chen, Yu-Lin Lin, Yi-Hao Chiu, Yi-Hao Chao, Hung-Wei Chen, Dylan Chen, Lo, Marty, Jia-Ming Lin, Chun-Ting Kuo, Jen-Hao Lo
Published in 2017 6th International Symposium on Next Generation Electronics (ISNE) (01.05.2017)
Published in 2017 6th International Symposium on Next Generation Electronics (ISNE) (01.05.2017)
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Conference Proceeding
Novel parasitic-SCR impacts on ESD robustness in the 60 V power pLDMOS devices
Shen-Li Chen, Chih-Hung Yang, Chih-Ying Yen, Kuei-Jyun Chen, Yi-Cih Wu, Jia-Ming Lin, Chun-Ting Kuo, Yu-Lin Lin, Yi-Hao Chiu, Yi-Hao Chao, Jen-Hao Lo, Hung-Wei Chen
Published in 2017 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-TW) (01.06.2017)
Published in 2017 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-TW) (01.06.2017)
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Conference Proceeding
Developing Flexible Carbon Nitride Quantum Dots Decorated Polyaniline Nanocomposite Layer for a Non-Invasive Wearable Sweat Biosensor for Glucose Monitoring
Chiu, Yi Hao, Guo, Yi-Ting, Rinawati, Mia, Chang, Ching-Cheng, Chang, Ling-Yu, Yeh, Min-Hsin
Published in Meeting abstracts (Electrochemical Society) (09.08.2024)
Published in Meeting abstracts (Electrochemical Society) (09.08.2024)
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Journal Article
ESD-Reliability Enhancement in a High-Voltage 60 V Square-Type PLDMOS by the Guard-Ring Engineering
Chen, Shen-Li, Chiu, Yi-Hao, Jhou, Yu-Lin, Wu, Pei-Lin, Lin, Po-Lin, Chen, Yu-Jen
Published in 2018 Asia-Pacific Microwave Conference (APMC) (01.11.2018)
Published in 2018 Asia-Pacific Microwave Conference (APMC) (01.11.2018)
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Conference Proceeding
Device for testing capacitor
WANG, YAO-NAN, CHENG, SHI-XUN, HUANG, JUN-WEI, CHIU, YI-HAO, YEH, CHIA-WEI
Year of Publication 01.02.2021
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Year of Publication 01.02.2021
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