TCAD-Machine Learning Framework for Device Variation and Operating Temperature Analysis With Experimental Demonstration
Wong, Hiu Yung, Xiao, Ming, Wang, Boyan, Chiu, Yan Ka, Yan, Xiaodong, Ma, Jiahui, Sasaki, Kohei, Wang, Han, Zhang, Yuhao
Published in IEEE journal of the Electron Devices Society (2020)
Published in IEEE journal of the Electron Devices Society (2020)
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