Short term reliability and robustness of ultra-thin barrier, 110 nm-gate AlN/GaN HEMTs
Gao, ZHan, Meneghini, Matteo, Harrouche, Kathia, Kabouche, Riad, Chiocchetta, Francesca, Okada, Etienne, Rampazzo, Fabiana, De Santi, Carlo, Medjdoub, Farid, Meneghesso, Gaudenzio, Zanoni, Enrico
Published in Microelectronics and reliability (01.08.2021)
Published in Microelectronics and reliability (01.08.2021)
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Journal Article
Thermally-activated failure mechanisms of 0.25 \ \mu \mathrm$ RF AIGaN/GaN HEMTs submitted to long-term life tests
Gao, Zhan, Chiocchetta, Francesca, Rampazzo, Fabiana, De Santi, Carlo, Fornasier, Mirko, Meneghesso, Gaudenzio, Meneghini, Matteo, Zanoni, Enrico
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling
Zanoni, Enrico, Meneghini, Matteo, Meneghesso, Gaudenzio, Rampazzo, Fabiana, Marcon, Daniele, Zhan, Veronica Gao, Chiocchetta, Francesca, Graff, Andreas, Altmann, Frank, Simon-Najasek, Michel, Poppitz, David
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding
Short Term Reliability and Robustness of ultra-thin barrier, 110 nm-gate AlN/GaN HEMTs
Gao, Zhan, Meneghini, Matteo, Harrouche, Kathia, Kabouche, Riad, Chiocchetta, Francesca, Marcon, Daniele, Okada, Etienne, Rampazzo, Fabiana, De Santi, Carlo, Medjdoub, Farid, Meneghesso, Gaudenzio, Zanoni, Enrico
Published in arXiv.org (30.07.2021)
Published in arXiv.org (30.07.2021)
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Paper
Journal Article
Short Term Reliability and Robustness of ultra-thin barrier, 110 nrn-gate AlN/GaN HEMTs
Gao, Zhan, Meneghini, Matteo, Harrouche, Kathia, Kabouche, Riad, Chiocchetta, Francesca, Okada, Etienne, Rampazzo, Fabiana, De Santi, Carlo, Medjdoub, Farid, Meneghesso, Gaudenzio, Zanoni, Enrico
Published in 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (20.07.2020)
Published in 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (20.07.2020)
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Conference Proceeding
Detrapping Kinetics in N-polar AlGaN/GaN MIS-HEMTs
Chiocchetta, Francesca, Calascione, Claudia, De Santi, Carlo, Sharma, Chandan, Rampazzo, Fabiana, Zheng, Xun, Romanczyk, Brian, Guidry, Matt, Li, Haoran, Keller, Stacia, Mishra, Umesh, Meneghesso, Gaudenzio, Meneghini, Matteo, Zanoni, Enrico
Published in 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) (07.11.2021)
Published in 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) (07.11.2021)
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Conference Proceeding