Random Dopant Fluctuation in Limited-Width FinFET Technologies
CHIANG, Meng-Hsueh, LIN, Jeng-Nan, KIM, Keunwoo, CHUANG, Ching-Te
Published in IEEE transactions on electron devices (01.08.2007)
Published in IEEE transactions on electron devices (01.08.2007)
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A Single-Ended Disturb-Free 9T Subthreshold SRAM With Cross-Point Data-Aware Write Word-Line Structure, Negative Bit-Line, and Adaptive Read Operation Timing Tracing
TU, Ming-Hsien, LIN, Jihi-Yu, CHUANG, Ching-Te, TSAI, Ming-Chien, LU, Chien-Yu, LIN, Yuh-Jiun, WANG, Meng-Hsueh, HUANG, Huan-Shun, LEE, Kuen-Di, SHIH, Wei-Chiang (willis), JOU, Shyh-Jye
Published in IEEE journal of solid-state circuits (01.06.2012)
Published in IEEE journal of solid-state circuits (01.06.2012)
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High-Density Reduced-Stack Logic Circuit Techniques Using Independent-Gate Controlled Double-Gate Devices
Chiang, M.-H., Kim, K., Chuang, C.-T., Tretz, C.
Published in IEEE transactions on electron devices (01.09.2006)
Published in IEEE transactions on electron devices (01.09.2006)
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Novel Cu-to-Cu Bonding With Ti Passivation at 180 ^ in 3-D Integration
Huang, Yan-Pin, Chien, Yu-San, Tzeng, Ruoh-Ning, Shy, Ming-Shaw, Lin, Teu-Hua, Chen, Kou-Hua, Chiu, Chi-Tsung, Chiou, Jin-Chern, Chuang, Ching-Te, Hwang, Wei, Tong, Ho-Ming, Chen, Kuan-Neng
Published in IEEE electron device letters (01.12.2013)
Published in IEEE electron device letters (01.12.2013)
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Analysis of GeOI FinFET 6T SRAM Cells With Variation-Tolerant WLUD Read-Assist and TVC Write-Assist
Hu, Vita Pi-Ho, Ming-Long Fan, Pin Su, Ching-Te Chuang
Published in IEEE transactions on electron devices (01.06.2015)
Published in IEEE transactions on electron devices (01.06.2015)
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Design and Analysis of Robust Tunneling FET SRAM
Yin-Nien Chen, Ming-Long Fan, Hu, Vita Pi-Ho, Pin Su, Ching-Te Chuang
Published in IEEE transactions on electron devices (01.03.2013)
Published in IEEE transactions on electron devices (01.03.2013)
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Journal Article
Comparative Leakage Analysis of GeOI FinFET and Ge Bulk FinFET
Hu, Vita Pi-Ho, Ming-Long Fan, Pin Su, Ching-Te Chuang
Published in IEEE transactions on electron devices (01.10.2013)
Published in IEEE transactions on electron devices (01.10.2013)
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Journal Article
Investigation of Backgate-Biasing Effect for Ultrathin-Body III-V Heterojunction Tunnel FET
Ming-Long Fan, Hu, Vita Pi-Ho, Yin-Nien Chen, Chih-Wei Hsu, Pin Su, Ching-Te Chuang
Published in IEEE transactions on electron devices (01.01.2015)
Published in IEEE transactions on electron devices (01.01.2015)
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A 0.5-V 28-nm 256-kb Mini-Array Based 6T SRAM With Vtrip-Tracking Write-Assist
Wu, Shang-Lin, Li, Kuang-Yu, Huang, Po-Tsang, Hwang, Wei, Tu, Ming-Hsien, Lung, Sheng-Chi, Peng, Wei-Sheng, Huang, Huan-Shun, Lee, Kuen-Di, Kao, Yung-Shin, Chuang, Ching-Te
Published in IEEE transactions on circuits and systems. I, Regular papers (01.07.2017)
Published in IEEE transactions on circuits and systems. I, Regular papers (01.07.2017)
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An Advanced 2.5-D Heterogeneous Integration Packaging for High-Density Neural Sensing Microsystem
Hu, Yu-Chen, Huang, Yu-Chieh, Huang, Po-Tsang, Wu, Shang-Lin, Chang, Hsiao-Chun, Yang, Yu-Tao, You, Yan-Huei, Chen, Jr-Ming, Huang, Yan-Yu, Lin, Yen-Han, Duann, Jeng-Ren, Chiu, Tzai-Wen, Hwang, Wei, Chuang, Ching-Te, Chiou, Jin-Chern, Chen, Kuan-Neng
Published in IEEE transactions on electron devices (01.04.2017)
Published in IEEE transactions on electron devices (01.04.2017)
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