Time-resolved microellipsometry for rapid thermal processes monitoring
Spesivtsev, E.V., Rykhlitsky, S.V., Shvets, V.A., Chikichev, S.I., Mardezhov, A.S., Nazarov, N.I., Volodin, V.A.
Published in Thin solid films (01.05.2004)
Published in Thin solid films (01.05.2004)
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Journal Article
Ellipsometric study of tellurium molecular beam interaction with dehydrogenated vicinal silicon surfaces
Shvets, V.A, Chikichev, S.I, Pridachin, D.N, Yakushev, M.V, Sidorov, Yu.G, Mardezhov, A.S
Published in Thin solid films (01.02.1998)
Published in Thin solid films (01.02.1998)
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Journal Article
Study of GaAs MBE growth under Ga-rich conditions by RHEED intensity oscillations
Bosacchi, A., Franchi, S., Kanter, Yu.O., Chikichev, S.I.
Published in Journal of crystal growth (01.08.1989)
Published in Journal of crystal growth (01.08.1989)
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Journal Article
Phase diagram for pseudomorphic Si/sub x/Ge/sub 1-x/ crystals
Chikichev, I.S., Vasev, A.V., Chikichev, S.I.
Published in 1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings (1997)
Published in 1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings (1997)
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Conference Proceeding
GaAs MBE growth under Ga-rich conditions studied by RHEED intensity oscillations
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Journal Article
Conference Proceeding