Machine-learning-based Dynamic IR Drop Prediction for ECO
Fang, Yen-Chun, Lin, Heng-Yi, Sui, Min-Yan, Li, Chien-Mo, Fang, Eric Jia-Wei
Published in 2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (05.11.2018)
Published in 2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (05.11.2018)
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Conference Proceeding
Test methodology for dual-rail asynchronous circuits
Kuan-Yen Huang, Ting-Yu Shen, Chien-Mo Li
Published in 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC) (01.06.2017)
Published in 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC) (01.06.2017)
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Conference Proceeding
Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis
Hsieh, Bing-Han, Liu, Yun-Sheng, Li, James Chien-Mo, Nigh, Chris, Chern, Mason, Bhargava, Gaurav
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
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Conference Proceeding
Diagnosis of Quantum Circuits in the NISQ Era
Li, Yu-Min, Hsieh, Cheng-Yun, Li, Yen-Wei, Li, James Chien-Mo
Published in 2023 IEEE 41st VLSI Test Symposium (VTS) (24.04.2023)
Published in 2023 IEEE 41st VLSI Test Symposium (VTS) (24.04.2023)
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Conference Proceeding
DR-Scan: Dual-Rail Asynchronous Scan DfT and ATPG
Hsieh, Shih-An, Wang, Ying-Hsu, Shen, Ting-Yu, Huang, Kuan-Yen, Pai, Chia-Cheng, Chen, Tsai-Chieh, Li, James Chien-Mo
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2019)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2019)
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Journal Article
Diagnosis of single stuck-at faults and multiple timing faults in scan chains
LI, James Chien-Mo
Published in IEEE transactions on very large scale integration (VLSI) systems (01.06.2005)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.06.2005)
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Journal Article
High-Speed, Low-Storage Power and Thermal Predictions for ATPG Test Patterns
Liang, Zhe-Jia, Wu, Yu-Tsung, Yang, Yun-Feng, Li, James Chien-Mo, Chang, Norman, Kumar, Akhilesh, Li, Ying-Shiun
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
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Conference Proceeding
Column Parity Row Selection (CPRS) BIST Diagnosis Technique: Modeling and Analysis
Li, James Chien-mo, Lin, Hung-mao, Wang, Fang-min
Published in IEEE transactions on computers (01.03.2007)
Published in IEEE transactions on computers (01.03.2007)
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Journal Article
A Multicircuit Simulator Based on Inverse Jacobian Matrix Reuse
Hung-I Lee, Chen-Yo Han, Li, James Chien-Mo
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.07.2016)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.07.2016)
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Journal Article
PSN-aware circuit test timing prediction using machine learning
Liu, Yu-Cheng, Han, Cheng-Yu, Lin, Shih-Yao, Li, James Chien-Mo
Published in Chronic diseases and translational medicine (01.03.2017)
Published in Chronic diseases and translational medicine (01.03.2017)
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Journal Article
Test Clock Domain Optimization to Avoid Scan Shift Failure Due to Flip-Flop Simultaneous Triggering
Yu-Chiuan Huang, Min-Hong Tsai, Wei-Sheng Ding, Li, J. C.-M, Ming-Tung Chang, Min-Hsiu Tsai, Chih-Mou Tseng, Hung-Chun Li
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.04.2013)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.04.2013)
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Journal Article
Effective and Economic Phase Noise Testing for Single-Chip TV Tuners
Li, JC-M, Lin, Po-Chou, Chiang, Chih-Ming, Pan, Chuo-Jan, Tseng, Chao-Wen
Published in IEEE transactions on instrumentation and measurement (01.10.2008)
Published in IEEE transactions on instrumentation and measurement (01.10.2008)
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Journal Article
Fault Simulation and Test Pattern Generation for Cross-gate Defects in FinFET Circuits
Kuan-Ying Chiang, Yu-Hao Ho, Yo-Wei Chen, Cheng-Sheng Pan, Li, James Chien-Mo
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
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Conference Proceeding
Journal Article