Characterization and Modeling of Flicker Noise in FinFETs at Advanced Technology Node
Kushwaha, Pragya, Agarwal, Harshit, Lin, Yen-Kai, Dasgupta, Avirup, Kao, Ming-Yen, Lu, Ye, Yue, Yun, Chen, Xiaonan, Wang, Joseph, Sy, Wing, Yang, Frank, Chidambaram, PR. Chidi, Salahuddin, Sayeef, Hu, Chenming
Published in IEEE electron device letters (01.06.2019)
Published in IEEE electron device letters (01.06.2019)
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Journal Article
Pattern Based Prediction for Plasma Etch
Abrokwah, K.O., Chidambaram, P.R., Boning, D.S.
Published in IEEE transactions on semiconductor manufacturing (01.05.2007)
Published in IEEE transactions on semiconductor manufacturing (01.05.2007)
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Journal Article
High Performance 5G Mobile SOC Productization with 4nm EUV Fin-FET Technology
Yuan, Jun, Deng, Jie, Lin, Vicki, Chen, Ying, Chiu, Joseph, Lin, Minghuei, Chen, Jun, Zhang, Deedee, Chen, Yukai, Liu, David, Yu, Bo, Wang, Hao, Nallapati, Giri, Mohan, Vivek, Sanaka, Venu, Baran, Berkan, Dahan, Frank, Bhadri, Prasad, Geol, Rajesh, Boynapalli, Venu, Bazarjani, Seyfi, Penzes, Paul, Agashe, Parag, Chidambaram, P. R.
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
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Conference Proceeding
Gate length dependent polysilicon depletion effects
Chang-Hoon Choi, Chidambaram, P.R., Khamankar, R., Machala, C.F., Zhiping Yu, Dutton, R.W.
Published in IEEE electron device letters (01.04.2002)
Published in IEEE electron device letters (01.04.2002)
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Journal Article
Dopant profile and gate geometric effects on polysilicon gate depletion in scaled MOS
Chang-Hoon Choi, Chidambaram, P.R., Khamankar, R., Machala, C.F., Zhiping Yu, Dutton, R.W.
Published in IEEE transactions on electron devices (01.07.2002)
Published in IEEE transactions on electron devices (01.07.2002)
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Journal Article
PPAC scaling enablement for 5nm mobile SoC technology
Badaroglu, Mustafa, Xu, Jeff, Zhu, John, Da Yang, Bao, Jerry, Seung-Chul Song, Peijie Feng, Ritzenthaler, Romain, Mertens, Hans, Eneman, Geert, Horiguchi, Naoto, Smith, Jeffrey, Datta, Suman, Kohen, David, Po-Wen Chan, Keagan Chen, Chidi Chidambaram, P. R.
Published in 2017 47th European Solid-State Device Research Conference (ESSDERC) (01.09.2017)
Published in 2017 47th European Solid-State Device Research Conference (ESSDERC) (01.09.2017)
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Conference Proceeding
Silicon Process Impact on 5G NR mmWave Front End Design and Performance
Cheng, Chuan-Cheng, Dunworth, Jeremy, Kalpat, Sriram, Cheng, Haitao, Liu, Gang, Yang, Ming-Ta, Sy, Wing, Wang, Joseph, Sahota, Kamal, Chidambaram, PR. Chidi
Published in 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2019)
Published in 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2019)
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Conference Proceeding
Titanium preconditioning of Al2O3 for liquid-state processing of Al-Al2O3 composite materials
JAVERNICK, D. A, CHIDAMBARAM, P. R, EDWARDS, G. R
Published in Metallurgical and materials transactions. A, Physical metallurgy and materials science (1998)
Published in Metallurgical and materials transactions. A, Physical metallurgy and materials science (1998)
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Conference Proceeding
Journal Article
The nature of interfacial phenomena at copper-titanium/alumina and copper-oxygen/alumina interfaces
Chidambaram, P.R., Meier, A., Edwards, G.R.
Published in Materials science & engineering. A, Structural materials : properties, microstructure and processing (28.02.1996)
Published in Materials science & engineering. A, Structural materials : properties, microstructure and processing (28.02.1996)
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Journal Article
The effect of large oxygen additions on the wettability and work of adhesion of copper-oxygen alloys on polycrystalline alumina
Meier, A., Baldwin, M.D., Chidambaram, P.R., Edwards, G.R.
Published in Materials science & engineering. A, Structural materials : properties, microstructure and processing (15.06.1995)
Published in Materials science & engineering. A, Structural materials : properties, microstructure and processing (15.06.1995)
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Journal Article
Characterization of high temperature hot dip galvanized coatings
Chidambaram, P.R., Rangarajan, V., van Ooij, W.J.
Published in Surface & coatings technology (01.09.1991)
Published in Surface & coatings technology (01.09.1991)
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Journal Article
35% drive current improvement from recessed-SiGe drain extensions on 37 nm gate length PMOS
Chidambaram, P.R., Smith, B.A., Hall, L.H., Bu, H., Chakravarthi, S., Kim, Y., Samoilov, A.V., Kim, A.T., Jones, P.J., Irwin, R.B., Kim, M.J., Rotondaro, A.L.P., Machala, C.F., Grider, D.T.
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
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Conference Proceeding
Silicon Process Impact on 5G NR mmWave Front End Design and Performance
Cheng, Chuan-Cheng, Dunworth, Jeremy, Kalpat, Sriram, Cheng, Haitao, Liu, Gang, Yang, Ming-Ta, Sy, Wing, Wang, Joseph, Sahota, Kamal, Chidambaram, PR. Chidi
Published in 2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) (01.04.2019)
Published in 2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) (01.04.2019)
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Conference Proceeding
An enhanced 90nm high performance technology with strong performance improvements from stress and mobility increase through simple process changes
Khamankar, R., Bu, H., Bowen, C., Chakravarthi, S., Chidambaram, P.R., Bevan, M., Krishnan, A., Niimi, H., Smith, B., Blatchford, J., Hornung, B., Lu, J.P., Nicollian, P., Kirkpatrick, B., Miles, D., Hewson, M., Farber, D., Hall, L., Alshareef, H., Varghese, A., Gurba, A., Ukraintsev, V., Rathsack, B., DeLoach, J., Tran, J., Kaneshige, C., Somervell, M., Aur, S., Machala, C., Grider, T.
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
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Conference Proceeding
7nm Mobile SoC and 5G Platform Technology and Design Co-Development for PPA and Manufacturability
Cai, Ming, Park, Hyunwoo, Yang, Jackie, Suh, Youseok, Chen, Jun, Gao, Yandong, Chang, Lunwei, Zhu, John, Song, S C, Choi, Jihong, Chen, Gary, Yu, Bo, Wang, Xiao-Yong, Huang, Vincent, Reddy, Gudoor, Kelageri, Nagaraj, Kidd, David, Penzes, Paul, Chung, Wayne, Yang, S.H., Lee, S.B., Tien, B.Z., Nallapati, Giri, Wu, S.-Y., Chidambaram, P. R.
Published in 2019 Symposium on VLSI Technology (01.06.2019)
Published in 2019 Symposium on VLSI Technology (01.06.2019)
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Conference Proceeding
Investigation of electrically gate-all-around hexagonal nanowire FET (HexFET) architecture for 5 nm node logic and SRAM applications
Smith, Jeffrey A., Ni, Kai, Ghosh, Ram Krishna, Xu, Jeff, Badaroglu, Mustafa, Chidi Chidambaram, P.R., Datta, Suman
Published in 2017 47th European Solid-State Device Research Conference (ESSDERC) (01.09.2017)
Published in 2017 47th European Solid-State Device Research Conference (ESSDERC) (01.09.2017)
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Conference Proceeding
Cost effective 28nm LP SoC technology optimized with circuit/device/process co-design for smart mobile devices
Chidambaram, P R, Gan, C, Sengupta, S, Ge, L, Chen, Y, Yang, S, Liu, P, Wang, J, Yang, M, Teng, C, Du, Y, Patel, P, Kamal, P, Bucki, R, Vang, F, Datta, A, Bellur, K, Yoon, S, Chen, N, Thean, A, Han, M, Terzioglu, E, Zhang, X, Fischer, J, Sani, M, Flederbach, B, Yeap, G
Published in 2010 International Electron Devices Meeting (01.12.2010)
Published in 2010 International Electron Devices Meeting (01.12.2010)
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Conference Proceeding