Characterization and Modeling of Flicker Noise in FinFETs at Advanced Technology Node
Kushwaha, Pragya, Agarwal, Harshit, Lin, Yen-Kai, Dasgupta, Avirup, Kao, Ming-Yen, Lu, Ye, Yue, Yun, Chen, Xiaonan, Wang, Joseph, Sy, Wing, Yang, Frank, Chidambaram, PR. Chidi, Salahuddin, Sayeef, Hu, Chenming
Published in IEEE electron device letters (01.06.2019)
Published in IEEE electron device letters (01.06.2019)
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Journal Article
Silicon Process Impact on 5G NR mmWave Front End Design and Performance
Cheng, Chuan-Cheng, Dunworth, Jeremy, Kalpat, Sriram, Cheng, Haitao, Liu, Gang, Yang, Ming-Ta, Sy, Wing, Wang, Joseph, Sahota, Kamal, Chidambaram, PR. Chidi
Published in 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2019)
Published in 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2019)
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Conference Proceeding
Silicon Process Impact on 5G NR mmWave Front End Design and Performance
Cheng, Chuan-Cheng, Dunworth, Jeremy, Kalpat, Sriram, Cheng, Haitao, Liu, Gang, Yang, Ming-Ta, Sy, Wing, Wang, Joseph, Sahota, Kamal, Chidambaram, PR. Chidi
Published in 2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) (01.04.2019)
Published in 2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) (01.04.2019)
Get full text
Conference Proceeding