Single-Event Effect Characterization of 16 GHz Phase-Locked Loop in Sub-20 nm FinFET Technology
Sun, Hanhan, Wu, Zirui, Luo, Deng, Liang, Bin, Chen, Jianjun, Chi, Yaqing
Published in IEEE transactions on nuclear science (01.09.2024)
Published in IEEE transactions on nuclear science (01.09.2024)
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Journal Article
Soft Error Tolerant Bandgap Reference Utilizing Single-Event Transient Filtering Technique
Liu, Jingtian, Wang, Dongsheng, Liang, Bin, Chi, Yaqing, Luo, Deng, Xu, Shi
Published in IEEE transactions on nuclear science (01.04.2024)
Published in IEEE transactions on nuclear science (01.04.2024)
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Journal Article
Research on Single Event Transients in Linear Voltage Regulators in a 28 nm Bulk CMOS Technology
Shen, Fan, Chen, Jianjun, Chi, Yaqing, Liang, Bin, Sun, Hanhan, Wen, Yi, Guo, Hao, Wang, Xun
Published in IEEE transactions on nuclear science (01.04.2024)
Published in IEEE transactions on nuclear science (01.04.2024)
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Journal Article
Effect of Cell Placement on Single-Event Transient Pulse in a Bulk FinFET Technology
Huang, Pengcheng, Zhao, Zhenyu, Chi, Yaqing, Liang, Bin, Ma, Chiyuan, Sun, Qian, Wu, Zhenyu
Published in IEEE transactions on nuclear science (01.05.2021)
Published in IEEE transactions on nuclear science (01.05.2021)
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Journal Article
Higher NMOS single event transient susceptibility compared to PMOS in sub-20nm bulk FinFET
Sun, Qian, Guo, Yang, Liang, Bin, Tao, Ming, Chi, Yaqing, Huang, Pengcheng, Wu, Zhenyu, Luo, Deng, Chen, Jianjun
Published in IEEE electron device letters (01.10.2023)
Published in IEEE electron device letters (01.10.2023)
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Journal Article
A Body-Biasing Technique for Single-Event Transient Mitigation in 28-nm Bulk CMOS Process
Liu, Jingtian, Liang, Bin, Guo, Yang, Chen, Jianjun, Chi, Yaqing, Sun, Qian, Song, Shengyu, Yuan, Hengzhou
Published in IEEE transactions on nuclear science (01.12.2021)
Published in IEEE transactions on nuclear science (01.12.2021)
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Journal Article
Gate breakdown induced stuck bits in sub-20 nm FinFET SRAM
Sun, Qian, Chi, Yaqing, Guo, Yang, Liang, Bin, Tao, Ming, Wu, Zhenyu, Guo, Hongxia, Zheng, Qiwen, Chen, Wangyong, Gao, Yulin, Zhao, Peixiong, Li, Xingji, Chen, Jianjun, Luo, Deng, Sun, Hanhan, Fang, Yahao
Published in Applied physics letters (08.07.2024)
Published in Applied physics letters (08.07.2024)
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Journal Article
Machine Learning-Based Soft-Error-Rate Evaluation for Large-Scale Integrated Circuits
Song, Ruiqiang, Shao, Jinjin, Chi, Yaqing, Liang, Bin, Chen, Jianjun, Wu, Zhenyu
Published in Electronics (Basel) (01.12.2023)
Published in Electronics (Basel) (01.12.2023)
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Journal Article
A SET-Tolerant High-Frequency Multibiased Multiphase Voltage-Controlled Oscillator for Phase Interpolator-Based Clock and Data Recovery
Hengzhou, Yuan, Hao, Sang, Bin, Liang, Jianjun, Chen, Yaqing, Chi, Weixia, Xu, Yang, Guo
Published in IEEE transactions on nuclear science (01.07.2022)
Published in IEEE transactions on nuclear science (01.07.2022)
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Journal Article
SEU Tolerance Efficiency of Multiple Layout-Hardened 28 nm DICE D Flip-Flops
Chi, Yaqing, Cai, Chang, He, Ze, Wu, Zhenyu, Fang, Yahao, Chen, Jianjun, Liang, Bin
Published in Electronics (Basel) (01.04.2022)
Published in Electronics (Basel) (01.04.2022)
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Journal Article
Characterization of Single-Event Transient Pulse Broadening Effect in 65 nm Bulk Inverter Chains Using Heavy Ion Microbeam
Chi, Yaqing, Song, Ruiqiang, Shi, Shuting, Liu, Biwei, Cai, Li, Hu, Chunmei, Guo, Gang
Published in IEEE transactions on nuclear science (01.01.2017)
Published in IEEE transactions on nuclear science (01.01.2017)
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Journal Article