A compact model for multi-island single electron transistors
Chi, Yaqing, Zhong, Haiqin, Zhang, Chao, Fang, Liang
Published in Journal of nanoscience and nanotechnology (01.12.2011)
Published in Journal of nanoscience and nanotechnology (01.12.2011)
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Journal Article
Effect of self and cross-coupling capacitance on stability diagram in a metallic double-dot device
Bingcai Sui, Liang Fang, Yaqing Chi
Published in 2010 International Conference on Nanoscience and Nanotechnology (01.02.2010)
Published in 2010 International Conference on Nanoscience and Nanotechnology (01.02.2010)
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Conference Proceeding
A compact model for multi-island single electron transistors
Yaqing Chi, Haiqin Zhong, Chao Zhang, Liang Fang
Published in 2010 3rd International Nanoelectronics Conference (INEC) (01.01.2010)
Published in 2010 3rd International Nanoelectronics Conference (INEC) (01.01.2010)
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Conference Proceeding
Reconfigurable logic gate implemented by suspended-gate single-electron transistors
Bingcai Sui, Liang Fang, Yaqing Chi
Published in 2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems (01.01.2010)
Published in 2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems (01.01.2010)
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Conference Proceeding
nSET: Novel simulation method for single-electron tunnel device with 1-Dimension multiple islands
Bingcai Sui, Yaqing Chi, Liang Fang
Published in 2010 3rd International Nanoelectronics Conference (INEC) (01.01.2010)
Published in 2010 3rd International Nanoelectronics Conference (INEC) (01.01.2010)
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Conference Proceeding
Macromodeling of realistic single electron transistors for large scale circuit simulation
Haiqin Zhong, Yaqing Chi, He Sun, Chao Zhang, Liang Fang
Published in 2010 3rd International Nanoelectronics Conference (INEC) (01.01.2010)
Published in 2010 3rd International Nanoelectronics Conference (INEC) (01.01.2010)
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Conference Proceeding
Advances in the modeling of single electron transistors for the design of integrated circuit
Chi, Yaqing, Sui, Bingcai, Yi, Xun, Fang, Liang, Zhou, Hailiang
Published in Journal of nanoscience and nanotechnology (01.09.2010)
Published in Journal of nanoscience and nanotechnology (01.09.2010)
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Journal Article
Adsorption mechanism of SO2 on vacancy-defected graphene and Ti doped graphene: A DFT study
Zhang, Zhendong, Liang, Bin, Chi, Yaqing, Jiang, Yande, Song, Juan, Guo, Yang
Published in Superlattices and microstructures (01.11.2021)
Published in Superlattices and microstructures (01.11.2021)
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Journal Article
A novel fabrication method for titania resistive switching device
Sun, He, Chi, Yaqing, Zhu, Xuan, Zhong, Haiqin, Peng, Guanliang, Fang, Liang
Published in Journal of nanoscience and nanotechnology (01.11.2010)
Published in Journal of nanoscience and nanotechnology (01.11.2010)
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Journal Article
Characteristics of novel titanium oxide thin film used for nonvolatile memories
Liang Fang, He Sun, Yaqing Chi, Xuan Zhu, Chao Zhang, Yong Li
Published in 2010 International Conference on Nanoscience and Nanotechnology (01.02.2010)
Published in 2010 International Conference on Nanoscience and Nanotechnology (01.02.2010)
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Conference Proceeding
Characterization of the Effect of Pulse Quenching on Single-Event Transients in 65-nm Twin-Well and Triple-Well CMOS Technologies
Chen, Jianjun, Yu, Junting, Yu, Peifu, Liang, Bin, Chi, Yaqing
Published in IEEE transactions on device and materials reliability (01.03.2018)
Published in IEEE transactions on device and materials reliability (01.03.2018)
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Magazine Article
Experimental investigation of SEUs Induced by Heavy Ions in 28-nm FDSOI SRAMs
Xu, Jingyan, Guo, Yang, Song, Ruiqiang, Chi, Yaqing, Liang, Bin, Hu, Chunmei, Qu, Wanxia
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
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Conference Proceeding
PABAM: A Physics-Based Analytical Model to Estimate Bipolar Amplification Effect Induced Collected Charge at Circuit Level
Ruiqiang, Song, Shuming, Chen, Yankang, Du, Pengcheng, Huang, Jianjun, Chen, Yaqing, Chi
Published in IEEE transactions on device and materials reliability (01.12.2015)
Published in IEEE transactions on device and materials reliability (01.12.2015)
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Magazine Article