SEE and TID characterization of an 8 Gbps SST transmitter in a 28 nm bulk CMOS technology
Liang, Bin, Chen, Jianjun, Chi, Yaqing, Yuan, Hengzhou, Wen, Yi, Yao, Xiaohu, Sun, Hanhan
Published in Microelectronics and reliability (01.03.2023)
Published in Microelectronics and reliability (01.03.2023)
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Journal Article
Characterization of Single-Event Upsets Induced by High LET Heavy Ions in 16 nm bulk FinFET SRAMs
Yaqing, Chi, Pengcheng, Huang, Qian, Sun, Bin, Liang, Zhenyu, Zhao
Published in IEEE transactions on nuclear science (01.05.2022)
Published in IEEE transactions on nuclear science (01.05.2022)
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Journal Article
Current mirror featuring DTMOS for analog single-event transient mitigation in space application
Liu, Jingtian, Xu, Xinyu, Sun, Qian, Liang, Bin, Chen, Jianjun, Chi, Yaqing, Guo, Yang
Published in Semiconductor science and technology (01.08.2020)
Published in Semiconductor science and technology (01.08.2020)
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Journal Article
Sub-10 MeV proton-induced single-event transients in 65 nm CMOS inverter chains
Wu, Zhenyu, Chi, Yaqing, Chen, Jianjun, Huang, Pengcheng, Liang, Bin, Zhang, Xiaodong
Published in Microelectronics and reliability (01.10.2021)
Published in Microelectronics and reliability (01.10.2021)
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Journal Article
Synthesis of carbon nanowall by plasma-enhanced chemical vapor deposition method
Liu, Rulin, Chi, Yaqing, Fang, Liang, Tang, Zhensen, Yi, Xun
Published in Journal of nanoscience and nanotechnology (01.02.2014)
Published in Journal of nanoscience and nanotechnology (01.02.2014)
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Journal Article
Novel time redundant flip-flop structure to attenuate the single-event transient
Chunmei Hu, Yankang Du, Jianjun Chen, Yaqing Chi, Haiyan Chen
Published in 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2016)
Published in 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2016)
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Conference Proceeding
Comparison of radiation-induced charge sharing generated by heavy ion and pulsed laser
Song Ruiqiang, Chen Shuming, Han Jianwei, Chi Yaqing, Chen Rui, Liang Bin, Huang Pengcheng, Ma Yingqi, Shangguan Shipeng
Published in 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2016)
Published in 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2016)
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Conference Proceeding
Fabrication and testing of solution-processed carbon nanotube thin film transistor
Xun Yi, Liang Fang, Yaqing Chi, Bingcai Sui
Published in 2014 International Conference on Information Science, Electronics and Electrical Engineering (01.04.2014)
Published in 2014 International Conference on Information Science, Electronics and Electrical Engineering (01.04.2014)
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Conference Proceeding
Resistance uniformity of TiO2 memristor with different thin film thickness
Nuo Xu, Liang Fang, Yaqing Chi, Chao Zhang, Zhensen Tang
Published in 14th IEEE International Conference on Nanotechnology (01.08.2014)
Published in 14th IEEE International Conference on Nanotechnology (01.08.2014)
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Conference Proceeding
A low contact resistance graphene field effect transistor with single-layer-channel and multi-layer-contact
Honghui Sun, Liang Fang, Yao Wang, Yaqing Chi, Rulin Liu
Published in 2014 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH) (01.07.2014)
Published in 2014 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH) (01.07.2014)
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Conference Proceeding
Implementation of Radiation Hardened Flip-Flops Based on Novel Fishbone Layouts
Cai, Chang, Wu, Zehao, Zhang, Jing, Ding, Luchang, Shen, Lei, Yu, Jun, Chi, Yaqing
Published in 2022 IEEE International Symposium on Circuits and Systems (ISCAS) (28.05.2022)
Published in 2022 IEEE International Symposium on Circuits and Systems (ISCAS) (28.05.2022)
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Conference Proceeding
Bulk Bias as an Analog Single-Event Transient Mitigation Technique with Negligible Penalty
Liu, Jingtian, Sun, Qian, Liang, Bin, Chen, Jianjun, Chi, Yaqing, Guo, Yang
Published in Electronics (Basel) (01.01.2020)
Published in Electronics (Basel) (01.01.2020)
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Journal Article
A Single-Event Upset Evaluation Approach Using Ion-Induced Sensitive Area
Song, Ruiqiang, Shao, Jinjin, Liang, Bin, Chi, Yaqing, Chen, Jianjun
Published in 2019 IEEE 13th International Conference on ASIC (ASICON) (01.10.2019)
Published in 2019 IEEE 13th International Conference on ASIC (ASICON) (01.10.2019)
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Conference Proceeding
Resistive switching effect in titanium oxides
Tang, Zhensen, Chi, Yaqing, Fang, Liang, Liu, Rulin, Yi, Xun
Published in Journal of nanoscience and nanotechnology (01.02.2014)
Published in Journal of nanoscience and nanotechnology (01.02.2014)
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Journal Article
Total Ionizing Dose Effect on Low On/Off Switching Ratio rmTiO 2 Memristive Memories
Chi, Yaqing, Liu, Rongrong, Tang, Zhensen, Song, Ruiqiang
Published in IEEE transactions on nuclear science (01.08.2014)
Published in IEEE transactions on nuclear science (01.08.2014)
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Journal Article