A system-level method for hardening phase-locked loop to single-event effects
Liang, Bin, Xu, Xinyu, Yuan, Hengzhou, Chen, Jianjun, Luo, Deng, Chi, Yaqing, Sun, Hanhan
Published in Materials research express (01.09.2022)
Published in Materials research express (01.09.2022)
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Journal Article
Novel Layout Technique for N-Hit Single-Event Transient Mitigation via Source-Extension
Chen, Jianjun, Chen, Shuming, He, Yibai, Chi, Yaqing, Qin, Junrui, Liang, Bin, Liu, Biwei
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs
Xu, Jingyan, Guo, Yang, Song, Ruiqiang, Liang, Bin, Chi, Yaqing
Published in Symmetry (Basel) (01.06.2019)
Published in Symmetry (Basel) (01.06.2019)
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Journal Article
Modeling the impact of process and operation variations on the soft error rate of digital circuits
Song, Ruiqiang, Chen, Shuming, Liang, Bin, Chi, Yaqing, Chen, Jianjun
Published in Science China. Information sciences (01.12.2017)
Published in Science China. Information sciences (01.12.2017)
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Journal Article
Total Ionizing Dose Effect on Low On/Off Switching Ratio Memristive Memories
Chi, Yaqing, Liu, Rongrong, Tang, Zhensen, Song, Ruiqiang
Published in IEEE transactions on nuclear science (01.08.2014)
Published in IEEE transactions on nuclear science (01.08.2014)
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Journal Article
Impact of Circuit Placement on Single Event Transients in 65 nm Bulk CMOS Technology
Yibai, He, Shuming, Chen, Jianjun, Chen, Yaqing, Chi, Bin, Liang, Biwei, Liu, Junrui, Qin, Yankang, Du, Pengcheng, Huang
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
Nano-Reconfigurable Cells With Hybrid Circuits of Single-Electron Transistors and MOSFETs
Sui, Bingcai, Fang, Liang, Chi, Yaqing, Zhang, Chao
Published in IEEE transactions on electron devices (01.09.2010)
Published in IEEE transactions on electron devices (01.09.2010)
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Journal Article
Comparison of single-event upset generated by heavy ion and pulsed laser
Liang, Bin, Song, Ruiqiang, Han, Jianwei, Chi, Yaqing, Chen, Rui, Hu, Chunmei, Chen, Jianjun, Ma, Yingqi, Shangguan, Shipeng
Published in Science China. Information sciences (01.07.2017)
Published in Science China. Information sciences (01.07.2017)
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Journal Article
Radiation Hardness Evaluation of the YHFT-DV Digital Signal Processor
Yaqing Chi, Bin Liang, Yongjie Sun, Yang Guo, Chen, Shuming
Published in 2017 IEEE Radiation Effects Data Workshop (REDW) (01.07.2017)
Published in 2017 IEEE Radiation Effects Data Workshop (REDW) (01.07.2017)
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Conference Proceeding
A compact analytical model for multi-island single electron transistors
Yaqing Chi, Bingcai Sui, Liang Fang, Hailiang Zhou, Haiqing Zhong, He Sun
Published in 2009 IEEE 8th International Conference on ASIC (01.10.2009)
Published in 2009 IEEE 8th International Conference on ASIC (01.10.2009)
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Conference Proceeding