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Year of Publication 27.03.2013
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Single-event-upset resistant resettable scan structure D trigger
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Year of Publication 27.03.2013
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Single-event-upset resistant resettable D trigger
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Year of Publication 19.12.2012
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Single event upset-resisting scanning structure D trigger capable of setting and resetting
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Year of Publication 11.12.2013
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D trigger provided with scanning structure and resisting single event upset
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Year of Publication 28.03.2012
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Year of Publication 28.03.2012
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Single event upset resistant synchronously resettable D flip-flop
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Year of Publication 28.03.2012
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Year of Publication 28.03.2012
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Settable and resettable D trigger resisting single event upset
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Year of Publication 28.03.2012
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Year of Publication 28.03.2012
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D trigger resisting single event upset
LI PENG, LIANG BIN, CHI YAQING, CHEN JIANJUN, HE YIBAI, LIU BIWEI, QIN JUNRUI, LIU ZHEN, DU YANKANG, CHEN SHUMING
Year of Publication 28.03.2012
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Year of Publication 28.03.2012
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Signal event upset resistance D trigger capable of being set and reset
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Year of Publication 28.03.2012
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Year of Publication 28.03.2012
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Signal event upset resistance D trigger capable of being set
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Year of Publication 28.03.2012
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Year of Publication 28.03.2012
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Single event upset resistant settable and resettable scan structure D flip-flop
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Year of Publication 28.03.2012
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Year of Publication 28.03.2012
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Single-event-upset resistant scan structure D trigger capable of being reset synchronously
LI PENG, LIU XIANGYUAN, LIANG BIN, CHI YAQING, CHEN JIANJUN, HE YIBAI, QIN JUNRUI, SUN YONGJIE, DU YANKANG
Year of Publication 22.02.2012
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Year of Publication 22.02.2012
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Single-event-upset resistant resettable scan structure D trigger
LI PENG, LIU XIANGYUAN, LIANG BIN, CHI YAQING, CHEN JIANJUN, HE YIBAI, QIN JUNRUI, SUN YONGJIE, DU YANKANG
Year of Publication 22.02.2012
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Year of Publication 22.02.2012
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Single-event-upset resistant resettable D trigger
LI PENG, LIANG BIN, CHI YAQING, CHEN JIANJUN, HE YIBAI, LIU BIWEI, QIN JUNRUI, SUN YONGJIE, LIU ZHEN, DU YANKANG
Year of Publication 22.02.2012
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Year of Publication 22.02.2012
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Single event upset resistant settable scanning structure D trigger
LI PENG, LIU XIANGYUAN, LIANG BIN, CHI YAQING, HU CHUNMEI, CHEN JIANJUN, HE YIBAI, LIU BIWEI, QIN JUNRUI, SUN YONGJIE, DU YANKANG
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Year of Publication 02.01.2013
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Readout amplifying circuit for resistive random access memory (RRAM) cell
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Single electron transistor based on ordered mesoporous and preparation method thereof
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Year of Publication 15.06.2011
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Year of Publication 15.06.2011
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Single event upset-resisting scanning structure D trigger capable of setting and resetting
LI PENG, LIU XIANGYUAN, LIANG BIN, CHI YAQING, HU CHUNMEI, CHEN JIANJUN, HE YIBAI, LIU BIWEI, QIN JUNRUI, SUN YONGJIE, DU YANKANG
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Year of Publication 28.03.2012
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