Demonstration and Modelling of Excellent RF Switch Performance of 22nm FD-SOI Technology for Millimeter-Wave Applications
Yadav, S., Chow, W.H., Bellaouar, A., Wong, J.S., Chen, T., Sekine, S., Schwan, C., Chin, M.S., Workman, G., Chew, K.W.J.
Published in ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) (01.09.2019)
Published in ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) (01.09.2019)
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Conference Proceeding
22nm FD-SOI Technology with Back-biasing Capability Offers Excellent Performance for Enabling Efficient, Ultra-low Power Analog and RF/Millimeter-Wave Designs
Ong, S.N., Chan, L.H.K., Chew, K.W.J., Lim, C.K., Oo, W. L., Bellaouar, A., Zhang, C., Chow, W.H., Chen, T., Rassel, R., Wong, J.S., Wan, C.W.F., Kim, J., Seet, W.H., Harame, D.
Published in 2019 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) (01.06.2019)
Published in 2019 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) (01.06.2019)
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Conference Proceeding
22nm Fully-Depleted SOI High Frequency Noise Modeling up to 90GHz Enabling Ultra Low Noise Millimetre-Wave LNA Design
Chan, L.H.K., Ong, S.N., Oo, W. L., Chew, K.W.J., Zhang, C., Bellaouar, A., Chow, W.H., Chen, T., Rassel, R., Wong, J.S., Lim, C.K., Wan, C.W.F., Kim, J., Seet, W.H., Harame, D.
Published in 2019 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) (01.06.2019)
Published in 2019 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) (01.06.2019)
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Conference Proceeding
Excellent 22FDX Hot-Carrier Reliability for PA Applications
Chen, T., Zhang, C., Arfaoui, W., Bellaouar, A., Embabi, S., Bossu, G., Siddabathula, M., Chew, K.W.J., Ong, S. N., Mantravadi, M., Barnett, K., Bordelon, J., Taylor, R., Janardhanan, S.
Published in 2019 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) (01.06.2019)
Published in 2019 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) (01.06.2019)
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Conference Proceeding
Impact of velocity saturation and hot carrier effects on channel thermal noise model of deep sub-micron MOSFETs
Ong, S.N., Yeo, K.S., Chew, K.W.J., Chan, L.H.K., Loo, X.S., Boon, C.C., Do, M.A.
Published in Solid-state electronics (01.06.2012)
Published in Solid-state electronics (01.06.2012)
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Journal Article
A new field dependent mobility model for high frequency channel thermal noise of deep submicron RFCMOS
Ong, S.N., Yeo, K.S., Chew, K.W.J., Chan, L.H.K., Loo, X.S., Boon, C.C., Do, M.A.
Published in Solid-state electronics (01.02.2012)
Published in Solid-state electronics (01.02.2012)
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Journal Article
High frequency drain current noise modeling in MOSFETs under sub-threshold condition
Chan, L.H.K., Yeo, K.S., Chew, K.W.J., Ong, S.N., Loo, X.S., Boon, C.C., Do, M.A.
Published in Proceedings of the 2009 12th International Symposium on Integrated Circuits (01.12.2009)
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Published in Proceedings of the 2009 12th International Symposium on Integrated Circuits (01.12.2009)
Conference Proceeding
A new unified model for channel thermal noise of deep sub-micron RFCMOS
Ong, S.N., Chew, K.W.J., Yeo, K.S., Chan, L.H.K., Loo, X.S., Boon, C.C., Do, M.A.
Published in 2009 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) (01.12.2009)
Published in 2009 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) (01.12.2009)
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Conference Proceeding
Analytical high frequency channel thermal noise modeling in deep sub-micron MOSFETs
Ong, S.N., Yeo, K.S., Chew, K.W.J., Chan, L.H.K., Loo, X.S., Do, M.A., Boon, C.C.
Published in Proceedings of the 2009 12th International Symposium on Integrated Circuits (01.12.2009)
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Published in Proceedings of the 2009 12th International Symposium on Integrated Circuits (01.12.2009)
Conference Proceeding
A novel de-embedding technique for On-Wafer characterization of RF CMOS
Loo, X.S., Yeo, K.S., Chew, K.W.J., Chan, L.H.K., Ong, S.N., Do, M.A., Boon, C.C.
Published in 2009 International SoC Design Conference (ISOCC) (01.11.2009)
Published in 2009 International SoC Design Conference (ISOCC) (01.11.2009)
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Conference Proceeding