Generalized Constant Current Method for Determining MOSFET Threshold Voltage
Bucher, Matthias, Makris, Nikolaos, Chevas, Loukas
Published in IEEE transactions on electron devices (01.11.2020)
Published in IEEE transactions on electron devices (01.11.2020)
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Journal Article
Total ionizing dose effects on analog performance of 65 nm bulk CMOS with enclosed-gate and standard layout
Bucher, Matthias, Nikolaou, Aristeidis, Papadopoulou, Alexia, Makris, Nikolaos, Chevas, Loukas, Borghello, Giulio, Koch, Henri D., Faccio, Federico
Published in 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2018)
Published in 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2018)
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Conference Proceeding
Verilog-A based implementation of Lorentzian noise spectra in compact models
Makris, Nikolaos, Chevas, Loukas, Bucher, Matthias
Published in 2023 International Conference on Noise and Fluctuations (ICNF) (17.10.2023)
Published in 2023 International Conference on Noise and Fluctuations (ICNF) (17.10.2023)
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Conference Proceeding
Generalized Constant Current Method for Determining MOSFET Threshold Voltage
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Paper
Journal Article
A Contribution to GaN HEMT Modeling and Parameter Extraction Including Temperature Dependence
Chevas, Loukas, Makris, Nikolaos, Kayambaki, Maria, Kostopoulos, Athanasios, Stavrinidis, Antonios, Konstantinidis, George, Bucher, Matthias
Published in 2022 IEEE Latin American Electron Devices Conference (LAEDC) (04.07.2022)
Published in 2022 IEEE Latin American Electron Devices Conference (LAEDC) (04.07.2022)
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Conference Proceeding
Design of Micropower Operational Transconductance Amplifiers for High Total Ionizing Dose Effects
Papadopoulou, Alexia, Makris, Nikolaos, Chevas, Loukas, Nikolaou, Aristeidis, Bucher, Matthias
Published in 2019 8th International Conference on Modern Circuits and Systems Technologies (MOCAST) (01.05.2019)
Published in 2019 8th International Conference on Modern Circuits and Systems Technologies (MOCAST) (01.05.2019)
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Conference Proceeding
Forward and Reverse Operation of Enclosed-Gate MOSFETs and Sensitivity to High Total Ionizing Dose
Nikolaou, Aristeidis, Chevas, Loukas, Papadopoulou, Alexia, Makris, Nikolaos, Bucher, Matthias, Borghello, Giulio, Faccio, Federico
Published in 2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems" (01.06.2019)
Published in 2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems" (01.06.2019)
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Conference Proceeding
Modeling of High Total Ionizing Dose (TID) Effects for Enclosed Layout Transistors in 65 nm Bulk CMOS
Nikolaou, Aristeidis, Bucher, Matthias, Makris, Nikolaos, Papadopoulou, Alexia, Chevas, Loukas, Borghello, Giulio, Koch, Henri D., Faccio, Federico
Published in 2018 International Semiconductor Conference (CAS) (01.10.2018)
Published in 2018 International Semiconductor Conference (CAS) (01.10.2018)
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Conference Proceeding
Investigation of Scaling and Temperature Effects in Total Ionizing Dose (TID) Experiments in 65 nm CMOS
Chevas, Loukas, Nikolaou, Aristeidis, Bucher, Matthias, Makris, Nikolaos, Papadopoulou, Alexia, Zografos, Apostolos, Borghello, Giulio, Koch, Henri D., Faccio, Federico
Published in 2018 25th International Conference "Mixed Design of Integrated Circuits and System" (MIXDES) (01.06.2018)
Published in 2018 25th International Conference "Mixed Design of Integrated Circuits and System" (MIXDES) (01.06.2018)
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Conference Proceeding
Extending a 65nm CMOS process design kit for high total ionizing dose effects
Nikolaou, Aristeidis, Bucher, Matthias, Makris, Nikos, Papadopoulou, Alexia, Chevas, Loukas, Borghello, Giulio, Koch, Henri D., Kloukinas, Kostas, Poikela, Tuomas S., Faccio, Federico
Published in 2018 7th International Conference on Modern Circuits and Systems Technologies (MOCAST) (01.05.2018)
Published in 2018 7th International Conference on Modern Circuits and Systems Technologies (MOCAST) (01.05.2018)
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Conference Proceeding