BMF-BD: Bayesian model fusion on Bernoulli distribution for efficient yield estimation of integrated circuits
Chenlei Fang, Fan Yang, Xuan Zeng, Xin Li
Published in 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) (01.06.2014)
Published in 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) (01.06.2014)
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Conference Proceeding
Efficient multivariate moment estimation via Bayesian model fusion for analog and mixed-signal circuits
Qicheng Huang, Chenlei Fang, Fan Yang, Xuan Zeng, Xin Li
Published in 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC) (07.06.2015)
Published in 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC) (07.06.2015)
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Conference Proceeding
Efficient performance modeling via Dual-Prior Bayesian Model Fusion for analog and mixed-signal circuits
Qicheng Huang, Chenlei Fang, Fan Yang, Xuan Zeng, Dian Zhou, Xin Li
Published in 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC) (05.06.2016)
Published in 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC) (05.06.2016)
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Conference Proceeding
Efficient bit error rate estimation for high-speed link by Bayesian model fusion
Chenlei Fang, Qicheng Huang, Fan Yang, Xuan Zeng, Xin Li, Chenjie Gu
Published in 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2015)
Published in 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2015)
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Conference Proceeding
Efficient performance modeling of analog integrated circuits via kernel density based sparse regression
Chenlei Fang, Qicheng Huang, Fan Yang, Xuan Zeng, Dian Zhou, Xin Li
Published in 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC) (05.06.2016)
Published in 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC) (05.06.2016)
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Conference Proceeding
Light-injection attack against practical continuous-variable measurement-device-independent quantum key distribution systems
Wang, Yiliang, Zheng, Yi, Fang, Chenlei, Shi, Haobin, Pan, Wei
Published in Optics express (09.09.2024)
Published in Optics express (09.09.2024)
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Journal Article
High-speed link verification based on statistical inference
Zeng, Xuan, Fang, Chenlei, Huang, Qicheng, Yang, Fan, Zhou, Dian, Cai, Wei, Shi, Weiping
Published in 2016 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2016)
Published in 2016 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2016)
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Conference Proceeding
Journal Article
LAIDAR: Learning for Accuracy and Ideal Diagnostic Resolution
Huang, Qicheng, Fang, Chenlei, Shawn Blanton, R. D.
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Improving Test Chip Design Efficiency via Machine Learning
Liu, Zeye, Huang, Qicheng, Fang, Chenlei, Blanton, R. D.
Published in 2019 IEEE International Test Conference (ITC) (01.11.2019)
Published in 2019 IEEE International Test Conference (ITC) (01.11.2019)
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Conference Proceeding
PGMOR: An Efficient Model Order Reduction Method for Power Grids
Qicheng Huang, Xiao Li, Chenlei Fang, Fan Yang, Yangfeng Su, Xuan Zeng
Published in 2015 14th International Conference on Computer-Aided Design and Computer Graphics (CAD/Graphics) (01.08.2015)
Published in 2015 14th International Conference on Computer-Aided Design and Computer Graphics (CAD/Graphics) (01.08.2015)
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Conference Proceeding
Improving Diagnosis Efficiency via Machine Learning
Huang, Qicheng, Fang, Chenlei, Mittal, Soumya, Blanton, R. D.
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)
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Conference Proceeding
Knowledge Transfer for Diagnosis Outcome Preview with Limited Data
Huang, Qicheng, Fang, Chenlei, Blanton, R. D. Shawn
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Memory-Efficient Adaptive Test Pattern Reordering for Accurate Diagnosis
Fang, Chenlei, Huang, Qicheng, Blanton, R. D. Shawn
Published in 2021 IEEE 39th VLSI Test Symposium (VTS) (25.04.2021)
Published in 2021 IEEE 39th VLSI Test Symposium (VTS) (25.04.2021)
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Conference Proceeding
Diagnosis Outcome Preview through Learning
Fang, Chenlei, Huang, Qicheng, Mittal, Soumya, Blanton, R. D. Shawn
Published in 2019 IEEE 37th VLSI Test Symposium (VTS) (01.04.2019)
Published in 2019 IEEE 37th VLSI Test Symposium (VTS) (01.04.2019)
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Conference Proceeding
An aggregating based model order reduction method for power grids
Huang, Qicheng, Li, Xiao, Fang, Chenlei, Yang, Fan, Su, Yangfeng, Zeng, Xuan
Published in Integration (Amsterdam) (01.09.2016)
Published in Integration (Amsterdam) (01.09.2016)
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Journal Article
IPSA: Integer Programming via Sparse Approximation for Efficient Test-Chip Design
Huang, Qicheng, Fang, Chenlei, Liu, Zeye, Ding, Ruizhou, Blanton, R. D. Shawn
Published in 2019 IEEE 37th International Conference on Computer Design (ICCD) (01.11.2019)
Published in 2019 IEEE 37th International Conference on Computer Design (ICCD) (01.11.2019)
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Conference Proceeding
Adaptive Test Pattern Reordering for Diagnosis using k-Nearest Neighbors
Fang, Chenlei, Huang, Qicheng, Blanton, R. D. Shawn
Published in 2020 IEEE International Test Conference in Asia (ITC-Asia) (01.09.2020)
Published in 2020 IEEE International Test Conference in Asia (ITC-Asia) (01.09.2020)
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Conference Proceeding
Diagnosis Outcome Prediction on Limited Data via Transferred Random Forest
Huang, Qicheng, Fang, Chenlei, Blanton, R. D. Shawn
Published in 2020 IEEE International Test Conference in Asia (ITC-Asia) (01.09.2020)
Published in 2020 IEEE International Test Conference in Asia (ITC-Asia) (01.09.2020)
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Conference Proceeding