Comparison of the Hot Carrier Degradation of N- and P-Type Fin Field-Effect Transistors in 14-nm Technology Nodes
Ciou, Fong-Min, Lin, Jia-Hong, Chen, Po-Hsun, Chang, Ting-Chang, Chang, Kai-Chun, Hsu, Jui-Tse, Lin, Yu-Shan, Jin, Fu-Yuan, Hung, Wei-Chun, Yeh, Chien-Hung, Kuo, Ting-Tzu, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han
Published in IEEE electron device letters (01.10.2021)
Published in IEEE electron device letters (01.10.2021)
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Journal Article
Investigation of HCD- and NBTI-Induced Ultralow Electric Field GIDL in 14-nm Technology Node FinFETs
Ciou, Fong-Min, Hsu, Jui-Tse, Chang, Ting-Chang, Lin, Chien-Yu, Jin, Fu-Yuan, Lin, Yu-Shan, Hung, Wei-Chun, Chang, Kai-Chun, Chang, Yen-Cheng, Lin, Yun-Hsuan, Hung, Yang-Hao, Huang, Jen-Wei, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han
Published in IEEE transactions on electron devices (01.07.2020)
Published in IEEE transactions on electron devices (01.07.2020)
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Journal Article
Abnormal Increment Substrate Current After Hot Carrier Stress in n-FinFET
Lin, Yu-Shan, Lin, Chien-Yu, Chang, Ting-Chang, Lin, Yun-Hsuan, Chang, Yen-Cheng, Chen, Kuan-Hsu, Liao, Jih-Chien, Jin, Fu-Yuan, Ciou, Fong-Min, Hung, Wei-Chun, Chang, Kai-Chun, Hung, Yang-Hao, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han
Published in IEEE electron device letters (01.01.2020)
Published in IEEE electron device letters (01.01.2020)
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Journal Article
Abnormal Relationship Between Hot Carrier Stress Degradation and Body Current in High-k Metal Gate in the 14-nm Node
Chang, Kai-Chun, Liao, Jih-Chien, Chang, Ting-Chang, Yeh, Chien-Hung, Lin, Chien-Yu, Jin, Fu-Yuan, Lin, Yu-Shan, Ciou, Fong-Min, Hung, Wei-Chun, Lin, Yun-Hsuan, Lien, Chen-Hsin, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han
Published in IEEE electron device letters (01.04.2019)
Published in IEEE electron device letters (01.04.2019)
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Journal Article
Effects of the housing price to income ratio on tenure choice in Taiwan: forecasting performance of the hierarchical generalized linear model and traditional binary logistic regression model
Lee, Chun-Chang, Liang, Chih-Min, Chen, Jian-Zheng, Tung, Cheng-Huang
Published in Journal of housing and the built environment (01.12.2018)
Published in Journal of housing and the built environment (01.12.2018)
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Journal Article
Analysis of Oxide Trap Characteristics by Random Telegraph Signals in nMOSFETs With HfO2-Based Gate Dielectrics
Ching-En Chen, Ting-Chang Chang, Bo You, Jyun-Yu Tsai, Wen-Hung Lo, Szu-Han Ho, Kuan-Ju Liu, Ying-Hsin Lu, Xi-Wen Liu, Yu-Ju Hung, Tseung-Yuen Tseng, Osbert Cheng, Cheng-Tung Huang, Ching-Sen Lu
Published in IEEE electron device letters (01.04.2016)
Published in IEEE electron device letters (01.04.2016)
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Journal Article
Impact of Mechanical Strain on GIFBE in PD SOI p-MOSFETs as Indicated From NBTI Degradation
Wen-hung Lo, Ting-Chang Chang, Chih-Hao Dai, Wan-Lin Chung, Ching-En Chen, Szu-Han Ho, Cheng, Osbert, Cheng Tung Huang
Published in IEEE electron device letters (01.03.2012)
Published in IEEE electron device letters (01.03.2012)
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Journal Article
An Investigation of Anode Hole Injection-Induced Abnormal Body Current in n-Channel HfO2/TiN MOSFETs
Liao, Jih-Chien, Chen, Yu-Hsuan, Lien, Chen-Hsin, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han, Chang, Ting-Chang, Syong, Wei-Ren, Chang, Kai-Chun, Lu, Ying-Hsin, Liu, Hsi-Wen, Lin, Chien-Yu, Chen, Li-Hui, Jin, Fu-Yuan
Published in IEEE journal of the Electron Devices Society (01.01.2018)
Published in IEEE journal of the Electron Devices Society (01.01.2018)
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Journal Article
On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETs
Chih-Hao Dai, Ting-Chang Chang, An-Kuo Chu, Yuan-Jui Kuo, Fu-Yen Jian, Wen-Hung Lo, Szu-Han Ho, Ching-En Chen, Wan-Lin Chung, Jou-Miao Shih, Guangrui Xia, Cheng, Osbert, Cheng-Tung Huang
Published in IEEE electron device letters (01.07.2011)
Published in IEEE electron device letters (01.07.2011)
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Journal Article
Enhancement of CMOSFETs Performance by Utilizing SACVD-Based Shallow Trench Isolation for the 40-nm Node and Beyond
Yao-Tsung Huang, San-Lein Wu, Shoou-Jinn Chang, Chin-Kai Hung, Tzu-Juei Wang, Cheng-Wen Kuo, Cheng-Tung Huang, Cheng, Osbert
Published in IEEE transactions on nanotechnology (01.05.2011)
Published in IEEE transactions on nanotechnology (01.05.2011)
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Journal Article
Impact of post-metal deposition annealing temperature on performance and reliability of high-K metal-gate n-FinFETs
Lin, Chien-Yu, Chang, Ting-Chang, Liu, Kuan-Ju, Tsai, Jyun-Yu, Chen, Ching-En, Liu, Hsi-Wen, Lu, Ying-Hsin, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung
Published in Thin solid films (01.12.2016)
Published in Thin solid films (01.12.2016)
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Journal Article
Effects of fabrication method on defects induced by nitrogen diffusion to the hafnium oxide layer in metal–oxide–semiconductor field effect transistors
Lu, Ying-Hsin, Chang, Ting-Chang, Ho, Szu-Han, Chen, Ching-En, Tsai, Jyun-Yu, Liu, Kuan-Ju, Liu, Xi-Wen, Lin, Chien-yu, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Yen, Wei-Ting
Published in Thin solid films (01.12.2016)
Published in Thin solid films (01.12.2016)
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Journal Article
Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETs
Liu, Kuan-Ju, Chang, Ting-Chang, Yang, Ren-Ya, Chen, Ching-En, Ho, Szu-Han, Tsai, Jyun-Yu, Hsieh, Tien-Yu, Cheng, Osbert, Huang, Cheng-Tung
Published in Thin solid films (01.12.2014)
Published in Thin solid films (01.12.2014)
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Journal Article
The Impact of Luxury Housing on Neighborhood Housing Prices in Taipei City
Lee, Chun-Chang, Liang, Chih-Min, Tung, Cheng-Huang, Lu, Yu-Jian
Published in Asian economic and financial review (30.10.2018)
Published in Asian economic and financial review (30.10.2018)
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Journal Article
On the Origin of Hole Valence Band Injection on GIFBE in PD SOI n-MOSFETs
Chih-Hao Dai, Ting-Chang Chang, Ann-Kuo Chu, Yuan-Jui Kuo, Shih-Ching Chen, Chih-Chung Tsai, Szu-Han Ho, Wen-Hung Lo, Guangrui Xia, Cheng, Osbert, Cheng Tung Huang
Published in IEEE electron device letters (01.06.2010)
Published in IEEE electron device letters (01.06.2010)
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Journal Article
Enhanced gate-induced floating-body effect in PD SOI MOSFET under external mechanical strain
Dai, Chih-Hao, Chang, Ting-Chang, Chu, Ann-Kuo, Kuo, Yuan-Jui, Chen, Shih-Ching, Tsai, Chih-Tsung, Lo, Wen-Hung, Ho, Szu-Han, Xia, Guangrui, Cheng, Osbert, Huang, Cheng Tung
Published in Surface & coatings technology (25.11.2010)
Published in Surface & coatings technology (25.11.2010)
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Journal Article
Conference Proceeding
Impact of strain on gate-induced floating body effect for partially depleted silicon-on-insulator p-type metal–oxide–semiconductor-field-effect-transistors
Lo, Wen-Hung, Chang, Ting-Chang, Dai, Chih-Hao, Chung, Wan-Lin, Chen, Ching-En, Ho, Szu-Han, Tsai, Jyun-Yu, Chen, Hua-Mao, Liu, Guan-Ru, Cheng, Osbert, Huang, Cheng-Tung
Published in Thin solid films (15.01.2013)
Published in Thin solid films (15.01.2013)
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Journal Article
Conference Proceeding