Search Results - "Cheng Tung Huang" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Comparison of the Hot Carrier Degradation of N- and P-Type Fin Field-Effect Transistors in 14-nm Technology Nodes

Comparison of the Hot Carrier Degradation of N- and P-Type Fin Field-Effect Transistors in 14-nm Technology Nodes

by Ciou, Fong-Min, Lin, Jia-Hong, Chen, Po-Hsun, Chang, Ting-Chang, Chang, Kai-Chun, Hsu, Jui-Tse, Lin, Yu-Shan, Jin, Fu-Yuan, Hung, Wei-Chun, Yeh, Chien-Hung, Kuo, Ting-Tzu, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han
Published in IEEE electron device letters (01.10.2021)

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Journal Article

Investigation of HCD- and NBTI-Induced Ultralow Electric Field GIDL in 14-nm Technology Node FinFETs

Investigation of HCD- and NBTI-Induced Ultralow Electric Field GIDL in 14-nm Technology Node FinFETs

by Ciou, Fong-Min, Hsu, Jui-Tse, Chang, Ting-Chang, Lin, Chien-Yu, Jin, Fu-Yuan, Lin, Yu-Shan, Hung, Wei-Chun, Chang, Kai-Chun, Chang, Yen-Cheng, Lin, Yun-Hsuan, Hung, Yang-Hao, Huang, Jen-Wei, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han
Published in IEEE transactions on electron devices (01.07.2020)

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Journal Article

Multi-Product Shipment and Production Scheduling Mathematical Model under Different Distribution Policies

Multi-Product Shipment and Production Scheduling Mathematical Model under Different Distribution Policies

by Huang, Tung-Cheng, Chen, Tzu-Chia
Published in Industrial Engineering & Management Systems (01.06.2021)

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Journal Article

Abnormal Increment Substrate Current After Hot Carrier Stress in n-FinFET

Abnormal Increment Substrate Current After Hot Carrier Stress in n-FinFET

by Lin, Yu-Shan, Lin, Chien-Yu, Chang, Ting-Chang, Lin, Yun-Hsuan, Chang, Yen-Cheng, Chen, Kuan-Hsu, Liao, Jih-Chien, Jin, Fu-Yuan, Ciou, Fong-Min, Hung, Wei-Chun, Chang, Kai-Chun, Hung, Yang-Hao, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han
Published in IEEE electron device letters (01.01.2020)

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Journal Article

Abnormal Relationship Between Hot Carrier Stress Degradation and Body Current in High-k Metal Gate in the 14-nm Node

Abnormal Relationship Between Hot Carrier Stress Degradation and Body Current in High-k Metal Gate in the 14-nm Node

by Chang, Kai-Chun, Liao, Jih-Chien, Chang, Ting-Chang, Yeh, Chien-Hung, Lin, Chien-Yu, Jin, Fu-Yuan, Lin, Yu-Shan, Ciou, Fong-Min, Hung, Wei-Chun, Lin, Yun-Hsuan, Lien, Chen-Hsin, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han
Published in IEEE electron device letters (01.04.2019)

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Journal Article

Effects of the housing price to income ratio on tenure choice in Taiwan: forecasting performance of the hierarchical generalized linear model and traditional binary logistic regression model

Effects of the housing price to income ratio on tenure choice in Taiwan: forecasting performance of the hierarchical generalized linear model and traditional binary logistic regression model

by Lee, Chun-Chang, Liang, Chih-Min, Chen, Jian-Zheng, Tung, Cheng-Huang
Published in Journal of housing and the built environment (01.12.2018)

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Journal Article

Analysis of Oxide Trap Characteristics by Random Telegraph Signals in nMOSFETs With HfO2-Based Gate Dielectrics

Analysis of Oxide Trap Characteristics by Random Telegraph Signals in nMOSFETs With HfO2-Based Gate Dielectrics

by Ching-En Chen, Ting-Chang Chang, Bo You, Jyun-Yu Tsai, Wen-Hung Lo, Szu-Han Ho, Kuan-Ju Liu, Ying-Hsin Lu, Xi-Wen Liu, Yu-Ju Hung, Tseung-Yuen Tseng, Osbert Cheng, Cheng-Tung Huang, Ching-Sen Lu
Published in IEEE electron device letters (01.04.2016)

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Journal Article

Impact of Mechanical Strain on GIFBE in PD SOI p-MOSFETs as Indicated From NBTI Degradation

Impact of Mechanical Strain on GIFBE in PD SOI p-MOSFETs as Indicated From NBTI Degradation

by Wen-hung Lo, Ting-Chang Chang, Chih-Hao Dai, Wan-Lin Chung, Ching-En Chen, Szu-Han Ho, Cheng, Osbert, Cheng Tung Huang
Published in IEEE electron device letters (01.03.2012)

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Journal Article

An Investigation of Anode Hole Injection-Induced Abnormal Body Current in n-Channel HfO2/TiN MOSFETs

An Investigation of Anode Hole Injection-Induced Abnormal Body Current in n-Channel HfO2/TiN MOSFETs

by Liao, Jih-Chien, Chen, Yu-Hsuan, Lien, Chen-Hsin, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han, Chang, Ting-Chang, Syong, Wei-Ren, Chang, Kai-Chun, Lu, Ying-Hsin, Liu, Hsi-Wen, Lin, Chien-Yu, Chen, Li-Hui, Jin, Fu-Yuan
Published in IEEE journal of the Electron Devices Society (01.01.2018)

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Journal Article

On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETs

On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETs

by Chih-Hao Dai, Ting-Chang Chang, An-Kuo Chu, Yuan-Jui Kuo, Fu-Yen Jian, Wen-Hung Lo, Szu-Han Ho, Ching-En Chen, Wan-Lin Chung, Jou-Miao Shih, Guangrui Xia, Cheng, Osbert, Cheng-Tung Huang
Published in IEEE electron device letters (01.07.2011)

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Journal Article

Stroke-order-free on-line Chinese character recognition by stroke adjustment of two-layer bipartite weighted matching

Stroke-order-free on-line Chinese character recognition by stroke adjustment of two-layer bipartite weighted matching

by Tung, Cheng-Huang, Jean, En-Yih
Published in Future generation computer systems (01.04.2018)

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Journal Article

Enhancement of CMOSFETs Performance by Utilizing SACVD-Based Shallow Trench Isolation for the 40-nm Node and Beyond

Enhancement of CMOSFETs Performance by Utilizing SACVD-Based Shallow Trench Isolation for the 40-nm Node and Beyond

by Yao-Tsung Huang, San-Lein Wu, Shoou-Jinn Chang, Chin-Kai Hung, Tzu-Juei Wang, Cheng-Wen Kuo, Cheng-Tung Huang, Cheng, Osbert
Published in IEEE transactions on nanotechnology (01.05.2011)

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Journal Article

Impact of post-metal deposition annealing temperature on performance and reliability of high-K metal-gate n-FinFETs

Impact of post-metal deposition annealing temperature on performance and reliability of high-K metal-gate n-FinFETs

by Lin, Chien-Yu, Chang, Ting-Chang, Liu, Kuan-Ju, Tsai, Jyun-Yu, Chen, Ching-En, Liu, Hsi-Wen, Lu, Ying-Hsin, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung
Published in Thin solid films (01.12.2016)

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Journal Article

Effects of fabrication method on defects induced by nitrogen diffusion to the hafnium oxide layer in metal–oxide–semiconductor field effect transistors

Effects of fabrication method on defects induced by nitrogen diffusion to the hafnium oxide layer in metal–oxide–semiconductor field effect transistors

by Lu, Ying-Hsin, Chang, Ting-Chang, Ho, Szu-Han, Chen, Ching-En, Tsai, Jyun-Yu, Liu, Kuan-Ju, Liu, Xi-Wen, Lin, Chien-yu, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Yen, Wei-Ting
Published in Thin solid films (01.12.2016)

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Journal Article

Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETs

Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETs

by Liu, Kuan-Ju, Chang, Ting-Chang, Yang, Ren-Ya, Chen, Ching-En, Ho, Szu-Han, Tsai, Jyun-Yu, Hsieh, Tien-Yu, Cheng, Osbert, Huang, Cheng-Tung
Published in Thin solid films (01.12.2014)

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Journal Article

The Impact of Luxury Housing on Neighborhood Housing Prices in Taipei City

The Impact of Luxury Housing on Neighborhood Housing Prices in Taipei City

by Lee, Chun-Chang, Liang, Chih-Min, Tung, Cheng-Huang, Lu, Yu-Jian
Published in Asian economic and financial review (30.10.2018)

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Journal Article

The Power of a Leading Indicators Fluctuation Trend for Forecasting Taiwans Real Estate Business Cycle: An Application of a Hidden Markov Model

The Power of a Leading Indicators Fluctuation Trend for Forecasting Taiwans Real Estate Business Cycle: An Application of a Hidden Markov Model

by Wu, Yun-Ling, Tung, Cheng-Huang, Lee, Chun-Chang
Published in Asian economic and financial review (2017)

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Journal Article

On the Origin of Hole Valence Band Injection on GIFBE in PD SOI n-MOSFETs

On the Origin of Hole Valence Band Injection on GIFBE in PD SOI n-MOSFETs

by Chih-Hao Dai, Ting-Chang Chang, Ann-Kuo Chu, Yuan-Jui Kuo, Shih-Ching Chen, Chih-Chung Tsai, Szu-Han Ho, Wen-Hung Lo, Guangrui Xia, Cheng, Osbert, Cheng Tung Huang
Published in IEEE electron device letters (01.06.2010)

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Journal Article

Enhanced gate-induced floating-body effect in PD SOI MOSFET under external mechanical strain

Enhanced gate-induced floating-body effect in PD SOI MOSFET under external mechanical strain

by Dai, Chih-Hao, Chang, Ting-Chang, Chu, Ann-Kuo, Kuo, Yuan-Jui, Chen, Shih-Ching, Tsai, Chih-Tsung, Lo, Wen-Hung, Ho, Szu-Han, Xia, Guangrui, Cheng, Osbert, Huang, Cheng Tung
Published in Surface & coatings technology (25.11.2010)

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Journal Article Conference Proceeding

Impact of strain on gate-induced floating body effect for partially depleted silicon-on-insulator p-type metal–oxide–semiconductor-field-effect-transistors

Impact of strain on gate-induced floating body effect for partially depleted silicon-on-insulator p-type metal–oxide–semiconductor-field-effect-transistors

by Lo, Wen-Hung, Chang, Ting-Chang, Dai, Chih-Hao, Chung, Wan-Lin, Chen, Ching-En, Ho, Szu-Han, Tsai, Jyun-Yu, Chen, Hua-Mao, Liu, Guan-Ru, Cheng, Osbert, Huang, Cheng-Tung
Published in Thin solid films (15.01.2013)

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Journal Article Conference Proceeding

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