Self-Heating-Effect-Induced Degradation Behaviors in a-InGaZnO Thin-Film Transistors
Hsieh, Tien-Yu, Chang, Ting-Chang, Chen, Te-Chih, Chen, Yu-Te, Tsai, Ming-Yen, Chu, Ann-Kuo, Chung, Yi-Chen, Ting, Hung-Che, Chen, Chia-Yu
Published in IEEE electron device letters (01.01.2013)
Published in IEEE electron device letters (01.01.2013)
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Journal Article
Investigating the Drain-Bias-Induced Degradation Behavior Under Light Illumination for InGaZnO Thin-Film Transistors
HSIEH, Tien-Yu, CHANG, Ting-Chang, CHEN, Te-Chih, TSAI, Ming-Yen, CHEN, Yu-Te, JIAN, Fu-Yen, CHUNG, Yi-Chen, TING, Hung-Che, CHEN, Chia-Yu
Published in IEEE electron device letters (01.07.2012)
Published in IEEE electron device letters (01.07.2012)
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Journal Article
Hot-Carrier Effect on Amorphous In-Ga-Zn-O Thin-Film Transistors With a Via-Contact Structure
HSIEH, Tien-Yu, CHANG, Ting-Chang, CHUNG, Wang-Cheng, CHANG, Jung-Fang, CHEN, Yu-Te, LIAO, Po-Yung, CHEN, Te-Chih, TSAI, Ming-Yen, CHEN, Yu-Chun, CHEN, Bo-Wei, CHU, Ann-Kuo, CHOU, Cheng-Hsu
Published in IEEE electron device letters (01.05.2013)
Published in IEEE electron device letters (01.05.2013)
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Journal Article
NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain
LIN, Chia-Sheng, CHEN, Ying-Chung, SHIH, Jou-Miao, CHANG, Ting-Chang, JIAN, Fu-Yen, HSU, Wei-Che, KUO, Yuan-Jui, DAI, Chih-Hao, CHEN, Te-Chih, LO, Wen-Hung, HSIEH, Tien-Yu
Published in IEEE electron device letters (01.07.2011)
Published in IEEE electron device letters (01.07.2011)
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Journal Article
Systematic Investigations on Self-Heating-Effect-Induced Degradation Behavior in a-InGaZnO Thin-Film Transistors
HSIEH, Tien-Yu, CHANG, Ting-Chang, CHEN, Te-Chih, CHEN, Yu-Te, TSAI, Ming-Yen, CHU, Ann-Kuo, CHUNG, Yi-Chen, TING, Hung-Che, CHEN, Chia-Yu
Published in IEEE transactions on electron devices (01.12.2012)
Published in IEEE transactions on electron devices (01.12.2012)
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Journal Article
Effect of N2O plasma treatment on the improvement of instability under light illumination for InGaZnO thin-film transistors
HSIEH, Tien-Yu, CHANG, Ting-Chang, CHEN, Te-Chih, TSAI, Ming-Yen, LU, Wei-Hsiang, CHEN, Shih-Cheng, JIAN, Fu-Yen, LIN, Chia-Sheng
Published in Thin solid films (30.12.2011)
Published in Thin solid films (30.12.2011)
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Conference Proceeding
Journal Article
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
HSIEH, Tien-Yu, CHANG, Ting-Chang, CHEN, Te-Chih, TSAI, Ming-Yen, CHEN, Yu-Te, JIAN, Fu-Yen, LIN, Chia-Sheng, TSAI, Wu-Wei, CHIANG, Wen-Jen, YAN, Jing-Yi
Published in Surface & coatings technology (01.09.2013)
Published in Surface & coatings technology (01.09.2013)
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Conference Proceeding
Journal Article
Characterization and Investigation of a Hot-Carrier Effect in Via-Contact Type a-InGaZnO Thin-Film Transistors
HSIEH, Tien-Yu, CHANG, Ting-Chang, CHUNG, Wang-Cheng, CHANG, Jung-Fang, CHEN, Yu-Te, LIAO, Po-Yung, CHEN, Te-Chih, TSAI, Ming-Yen, CHEN, Yu-Chun, CHEN, Bo-Wei, CHU, Ann-Kuo, CHOU, Cheng-Hsu
Published in IEEE transactions on electron devices (01.05.2013)
Published in IEEE transactions on electron devices (01.05.2013)
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Journal Article
Anomalous Capacitance Induced by GIDL in P-Channel LTPS TFTs
LIN, Chia-Sheng, CHEN, Ying-Chung, CHANG, Ting-Chang, CHEN, Shih-Ching, JIAN, Fu-Yen, LI, Hung-Wei, CHEN, Te-Chih, WENG, Chi-Feng, JIN LU, HSU, Wei-Che
Published in IEEE electron device letters (01.11.2009)
Published in IEEE electron device letters (01.11.2009)
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Journal Article
Analysis of Degradation Mechanism in SONOS-TFT Under Hot-Carrier Operation
CHEN, Te-Chih, CHANG, Ting-Chang, CHEN, Shih-Ching, HSIEH, Tien-Yu, JIAN, Fu-Yen, LIN, Chia-Sheng, LI, Hung-Wei, LEE, Ming-Hsien, CHEN, Jim-Shone, SHIH, Ching-Chieh
Published in IEEE electron device letters (01.12.2010)
Published in IEEE electron device letters (01.12.2010)
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Journal Article
Charge-Trapping-Induced Parasitic Capacitance and Resistance in SONOS TFTs Under Gate Bias Stress
LIN, Chia-Sheng, CHEN, Ying-Chung, CHEN, Jim-Shone, CHANG, Ting-Chang, JIAN, Fu-Yen, LI, Hung-Wei, CHEN, Shih-Ching, CHUANG, Ying-Shao, CHEN, Te-Chih, TAI, Ya-Hsiang, LEE, Ming-Hsien
Published in IEEE electron device letters (01.03.2011)
Published in IEEE electron device letters (01.03.2011)
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Journal Article
Retraction notice to “Investigating Degradation Behavior of InGaZnO Thin-Film Transistors induced by Charge-Trapping Effect under DC and AC Gate-Bias Stress” [Thin Solid Films, 528 (2013) 53–56]
Hsieh, Tien-Yu, Chang, Ting-Chang, Chen, Te-Chih, Tsai, Ming-Yen, Chen, Yu-Te
Published in Thin solid films (01.11.2018)
Published in Thin solid films (01.11.2018)
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Journal Article
Male pheasant-tailed jacanas commit infanticides to avoid cuckoldry when paternity of eggs is doubtful
Chen, Te-Chih, Lin, Yao-Sung, Deng, Po-Ling, Ding, Tzung-Su
Published in Journal of natural history (01.12.2008)
Published in Journal of natural history (01.12.2008)
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Journal Article
Improvement in the bias stability of amorphous InGaZnO TFTs using an Al2O3 passivation layer
HUANG, Sheng-Yao, CHANG, Ting-Chang, CHEN, Min-Chen, CHEN, Te-Chih, JIAN, Fu-Yen, CHEN, Yu-Chun, HUANG, Hui-Chun, GAN, Der-Shin
Published in Surface & coatings technology (25.09.2013)
Published in Surface & coatings technology (25.09.2013)
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Conference Proceeding
Investigating the degradation behavior under hot carrier stress for InGaZnO TFTs with symmetric and asymmetric structures
Tsai, Ming-Yen, Chang, Ting-Chang, Chu, Ann-Kuo, Chen, Te-Chih, Hsieh, Tien-Yu, Chen, Yu-Te, Tsai, Wu-Wei, Chiang, Wen-Jen, Yan, Jing-Yi
Published in Thin solid films (15.01.2013)
Published in Thin solid films (15.01.2013)
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Journal Article
Conference Proceeding
Investigating degradation behavior of InGaZnO thin-film transistors induced by charge-trapping effect under DC and AC gate bias stress
HSIEH, Tien-Yu, CHANG, Ting-Chang, CHEN, Te-Chih, TSAI, Ming-Yen, CHEN, Yu-Te
Published in Thin solid films (15.01.2013)
Published in Thin solid films (15.01.2013)
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Conference Proceeding
Journal Article
Analyzing the effects of ambient dependence for InGaZnO TFTs under illuminated bias stress
CHEN, Te-Chih, CHANG, Ting-Chang, HSIEH, Tien-Yu, TSAI, Ming-Yen, TSAI, Chih-Tsung, CHEN, Shih-Ching, LIN, Chia-Sheng, JIAN, Fu-Yen
Published in Surface & coatings technology (01.09.2013)
Published in Surface & coatings technology (01.09.2013)
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Conference Proceeding
Journal Article